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Quasi-TEM Analysis of a Shielded Microstrip Line of Elliptic Cross-Section with Finite Metallization Thickness Penetrating into the Substrate by the Finite Difference Method

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Abstract

A shielded microstripline (MSL) of elliptic cross-section with finite metallization thickness penetrating into the substrate is presented. The quasi-static characteristics of this kind of MSL are studied with finit difference method (FDM). The effect of metal cross-section shape and metal penetrating depth is also studied.

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Authors and Affiliations

  1. Communication Engineering Department, Shanghai University, Jiading Shanghai, 201800, People's Republic of China

    Qiang Wang, Changqing Liu & Ying Li

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  1. Qiang Wang
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  2. Changqing Liu
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  3. Ying Li
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Wang, Q., Liu, C. & Li, Y. Quasi-TEM Analysis of a Shielded Microstrip Line of Elliptic Cross-Section with Finite Metallization Thickness Penetrating into the Substrate by the Finite Difference Method. International Journal of Infrared and Millimeter Waves 21, 91–100 (2000). https://doi.org/10.1023/A:1006699022204

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