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  • 1985-1989  (2)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 5632-5634 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have found a new electron trap state in Si-doped AlxGa1−xAs by deep level transient spectroscopy and constant temperature capacitance transient measurements under strong light illumination. This new trap is shallower than the DX center associated with Si impurity in that its emission and capture activation energies are equal to 0.20±0.05 and 0.17±0.05 eV, respectively. Its maximum concentration is comparable to the concentration of the DX center. Possible origins of this new trap and its relationship to the DX center are discussed.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 33 (1987), S. 1517-1523 
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Understanding the deformation behavior of an amorphous thermoplastic, e.g., poly(ethylene terephthalate) (a-PET) and one of semicrystallinity, viz., i-PP, can be is of both fundamental and practical importance. Much has been done to study the influence of temperature and strain, but not the influence of deformation conditions on the three-dimensional orientation of many thermoplastic. In this study we consider the incremental effect of hydrostatic pressure and process geometry on strain-induced deformation. a-PET has been free drawn (i.e., no hydrostatic pressure) isothermally on a tenter frame device. The hydrostatic, equibiaxial deformation was achieved by a forging process involving squeezing between two circular plates. These two processes have been carried out at a series of deformation rates, with the three-dimensional refractive index measurements having been made on the PET and i-PP films using a modified Abbe refractometer, as per Samuels. The reported trirefringence measurement provides a sensitive scale for the planar deformation.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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