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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3350-3350 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Third-generation synchrotron x-ray facilities, such as the Advanced Photon Source, produce x-ray beams that generate a very high heat flux in a very small area. In order to preserve the brilliance of the source, optical components have to be designed to undergo very small thermal deformation (or a change of slope of a flat surface). When an optical component is subjected to a heat load, there will be thermal deformation caused by a temperature increase from the initial state. For a plate-like structure, the temperature difference over the thickness causes bending, and the average temperature increment causes axial deformation. For an optical element, the slope change due to bending is the main reason for the degradation of the performance of the optical component. The change of slope should be limited to a few microradians. There are many ways to control the thermal deformation, such as cryogenic cooling, inclined geometry, liquid-metal cooling, pin-posts or microchannels, using a high-heat-conductivity material, such as diamond, etc. In an accompanying conference paper, an adaptive design technique has been proposed to make use of a novel self-adapted smart structure. Its performance is essentially independent of the heat-load intensity. When such a device is exposed to a heat load, the flat surface remains flat in the area of interest. Therefore this technique can potentially be used to achieve a high precision optical component. Application of the proposed design technique to the monochromator for the SRI-CAT Sector 2 insertion device beamline (Sector 2-ID-E) is explained, and initial analytical results are presented on its performance. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3354-3354 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Third-generation synchrotron x-ray facilities, such as the Advanced Photon Source, generate a very high heat flux in a very small area. When an optical component is subjected to a heat load, there will be thermal deformation caused by a temperature increase. For a plate-like structure, the temperature difference over the thickness causes bending, and the average temperature increment causes axial deformation. For an optical element, the slope change due to bending is the main reason for the degradation of functionality in the optical component. In order to preserve photons, optical components have to be designed to have very small thermal deformation or small change of slope in the surface. Typically the change of slope is limited to a few microradians. The structure proposed here offers advantages in terms of cost, complexity, and operations. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: X-ray mirrors have the potential to be subjected to extremely high heat loads at third-generation synchrotron radiation sources. In many cases, sophisticated cooling methods will be required to prevent surface distortion that would otherwise degrade the intrinsic source brightness. As a diagnostic for such mirrors, we have previously proposed to modify the long trace optical profiler for use within a UHV mirror chamber [Shinan Qian et al., Optical Engineering 34, 396 (1995)], thereby making it feasible to take profile measurements of mirrors irradiated with high power x-ray beams. We present in detail the mechanical design of a complete in-situ measurement. The objective of developing an in-situ measurement system is to aid the development of reliable, low-cost, high-heat-load substrates for mirrors and multilayers. This will provide a firm basis on which to design new optical elements that will be necessary as a result of performance enhancements to current machines, as well as future generations of storage rings. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The analytical results and design considerations for a cryogenically cooled advanced photon source (APS) silicon monochromator are presented. The high conductivity and low thermal expansion coefficient of silicon at cryogenic temperatures are advantages that are used to solve the high-heat-flux problem from undulator radiation. The APS monochromator features a machined slot with variable thicknesses below the surface. This configuration is designed to reduce absorption by the crystal and decrease the maximum temperature of the crystal. The transmitted power through the crystal is absorbed by a second element that can be cooled by standard cooling techniques. Different parameters and configurations are analyzed to maximize the performance of the monochromator and minimize the total absorbed power by the crystal. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [s.l.] : Macmillian Magazines Ltd.
    Nature 424 (2003), S. 50-53 
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Advances in extreme-ultraviolet (EUV) and X-ray optics are providing powerful new capabilities in high-resolution imaging and trace-element analysis of microscopic specimens, and the potential for fabricating devices of smaller critical dimensions in next-generation integrated circuit ...
    Type of Medium: Electronic Resource
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