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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1455-1457 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new ultrahigh vacuum (UHV) scanning tunneling microscope design has been developed and optimized for in situ investigations of thin-film growth. The basic concept of the microscope is to retract the sample by means of the coarse positioning motor under an angle of 30° with respect to the piezotube scanner. This geometric arrangement allows normal film deposition and excludes any interaction between the evaporation beam and the tip. The instrument has the capability of regaining a particular microscopic location on the sample surface with an accuracy of less than 100 nm posterior to a sample displacement of more than 20 mm. Sequences of images of a spot during homoepitaxial growth of Cr on a Cr(100) single-crystal substrate have been obtained. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 63 (1996), S. 303-304 
    ISSN: 1432-0630
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract One-dimensional chain-like structures consisting of rows of single chromium adatoms have been obtained by annealing a submonolayer chromium film deposited under ultra-high vacuum (UHV) conditions onto a Cr(100) single crystal substrate. The self-organization of the Cr atoms under the influence of the substrate surface potential leads to two kinds of atomic rows orientated in orthogonal directions, thereby reflecting the symmetry of the Cr(100) surface potential. The formation of these atomic-scale wires has been monitored in-situ by means of a UHV scanning tunneling microscope (STM).
    Type of Medium: Electronic Resource
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