Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
70 (1997), S. 1563-1565
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
X-ray diffraction measurements have been carried out on epitaxial superlattices (SLs) in symmetric Laue geometry. High quality pseudomorphic CdF2/CaF2 SLs on Si(111) have been used as samples. Satellites, due to periodic variations of structural factor value, are revealed at ω-scanning rocking curves. A comparison of information about SL provided by diffraction in Bragg and Laue geometries is presented. The possibility of direct determination of SL structural parameters is discussed. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.118617
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