ISSN:
1432-0630
Keywords:
79.20
;
87
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract Secondary-ion mass spectroscopy (SIMS) is a hydrogen, isotope and compound sensitive analytical technique of extremely high absolute sensitivity. Continuing earlier measurements for carboxylic acids, adsorbed alcohols etc., we have carried out a systematical investigation of secondary-ion emission from metal-supported amino acids, containing various functional groups (e.g., alanine, phenylalanine, cysteine, arginine). In order to avoid damage effects we applied extremely small primary-ion current densities in the 10−9 A·cm−2 range. The main results of our investigations can be summarized as follows: - All investigated amino acids produce high-intensity secondary-ion parent peaks (M+1)+ and (M−1)−. - In addition positive as well as negative fragment ions representative for the different functional groups are emitted with high yields. - For 2.5 keV Ar+-ions the absolute yields for the parent ions and the most important fragment ions are in the range of 0.1; the damage cross section is 〉10−14 cm2 for all investigated acids. The resulting absolute sensitivities are below 10−6 of one monomolecular layer or 〈10−12 g. We infer from these results that static SIMS is an excellent tool for trace detection, structural investigation and surface reaction studies of amino acids.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00895013
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