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  • 1
    Keywords: Forschungsbericht
    Type of Medium: Online Resource
    Pages: Online-Ressource (105 S., 1,32 MB) , Ill., graph. Darst.
    Language: German
    Note: Förderkennzeichen BMBF 50JR0443 , Unterschiede zwischen dem gedruckten Dokument und der elektronischen Ressource können nicht ausgeschlossen werden , Auch als gedr. Ausg. vorhanden , Systemvoraussetzungen: Acrobat reader.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 653-657 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Calculable synchrotron radiation (SR) from BESSY dipole magnets has been used by PTB for radiometry from the visible to the soft x-ray region with very low uncertainties for many years. The use of wavelength shifter (WLS) radiation bears the potential of extending the usable spectral range for radiometry with calculable SR to higher photon energies. Initial investigations on the feasibility of this approach have been performed: an energy dispersive high-purity germanium detector (HPGe) was used to characterize the radiation of the new BESSY WLS with a magnetic field of B=3.2 T. The HPGe detector has previously been calibrated and so the absolute spectral photon flux could be determined. The measured spectral photon flux was then compared to calculations and good agreement was found in the order of ±5%. Although this is to our knowledge the best agreement demonstrated so far for an absolute comparison of measured WLS radiation to calculations, further improvements are needed for a future radiometric use of WLS radiation. This will be discussed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3229-3232 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new beamline for radiometric applications (e.g., detector calibration and reflectometry) has been installed and characterized at the laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY. The beamline is equipped with a SX700 type plane grating monochromator and a toroidal mirror behind the exit slit of the monochromator for collimating the radiation to allow angle resolved reflectometry. A divergence of 0.1 mrad has been achieved. The beamline has been optimized for high spectral purity of the radiation. Within the photon energy range from 40 to about 1500 eV the total amount of stray light and higher order radiation stays below 1%. A photon flux of up to 1011 s−1 has been measured in the focal point of the toroidal mirror. It corresponds to a radiant power of a few μW and thus allows use of a cryogenic radiometer for detector calibration. The details of the beamline layout and the results of the performance characterization are presented.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1147-1149 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Our approach to ion beam modeling breaks down the complex interplay of competing elementary processes into a series of independent consecutive steps. Thus, both in methodological development and computational modeling, the main effort can be directed towards the processes which are of greatest relevance in the context given. Moreover, employment of the special software available allows for comprehensive and efficient optimization of multigrid ion sources for low ion beam divergence and long lifetime, even in a personal computer environment. Here, for our Kaufman-type two-grid ion source RR-ISQ 76 some ion beam characteristics in their dependence on geometrical two-grid configuration are calculated and discussed, first of all in terms of shape and area of the plasma sheath. These dependencies are used to optimize this particular ion source for a low beam divergence. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2248-2250 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: At the radiometry laboratory of the Physikalisch-Technische Bundesanstalt (PTB) a reflectometer for the soft x-ray spectral region has been operated for several years utilizing monochromatic radiation of a toroidal grating monochromator or a high-resolution plane grating monochromator. The monochromators cover the photon energy region from 35 to 1500 eV. New challenges due to the development of soft x-ray optical components led to the design of a second reflectometer with advanced capabilities. Samples with a diameter of up to 250 mm can be accommodated. The time required for sample exchange is reduced by using a lock chamber. The feasibility of sample positioning with high precision has been improved. Typical uncertainties of about 1%–2%, e.g., for the reflectance of multilayer mirrors, can be achieved. A detailed description of the reflectometer as well as some typical results showing the performance are presented. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2570-2573 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The x-ray transmission properties of a very thin polyimide window in the range 7–310 A(ring) have been investigated. The window is nominally 0.24 μm thick and is supported by a hexagonal polyimide grid. Transmission of over 60% and 80% at the oxygen Kα and carbon Kα lines, respectively, have been achieved. The use of such windows as the entrance window of a gas scintillation counter (GSPC) operating as a broadband spectrometer at XUV wavelengths is discussed. Overall detector efficiencies of greater than 10% for wavelengths less than 150 A(ring) are possible to achieve. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 2974-2976 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter reports a measurement of the mean electron-hole pair creation energy in crystalline silicon using photons in the 50–1500 eV spectral range. A cryogenic electrical substitution radiometer in combination with monochromatized synchrotron radiation was used to determine the spectral responsivity of silicon photodiodes in this spectral range with a relative uncertainty of less than 0.3%. The mean electron-hole pair creation energy has been determined from these measurements and in contrast to recent theoretical and experimental results a constant value of (3.64±0.03) eV was obtained in accordance with a calculation presented here. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 2926-2939 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The photon energy dependence of the mean energy W required to produce an electron-hole pair in silicon for photons with energies between 50 and 1500 eV was determined from the spectral responsivity of selected silicon photodiodes. The spectral responsivity was measured with a relative uncertainty of less than 0.3% using monochromatized synchrotron radiation whose radiant power was measured with a cryogenic electrical substitution radiometer. In order to deduce W from the spectral responsivity of photodiodes with a relative uncertainty of about 1%, a method for the calculation of photon and electron escape losses from silicon photodiodes was developed and the model for the charge carrier recombination losses was improved. In contrast to recent theoretical and experimental results, a constant value W=(3.66±0.03) eV was obtained in the photon energy range from 50 to 1500 eV. The present experimental results are confirmed by calculation of the pair creation energy in silicon from data from the literature for the relevant material properties. The difference from previous theoretical work is due to different assumptions about the influence of the band structure of silicon. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 257-268 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: For many applications, the total electron yield (TEY) η is assumed to be proportional to the product of the linear absorption coefficient and the photon energy. To test this model we measured the total electron yield of copper and gold at the (111) surface of single crystals in the photon energy range between 50 eV and 1500 eV with relative uncertainties lower than 3.6%. In addition, the data for the absorption coefficient were improved by measuring the transmittance of polyimide films covered either with thin gold or copper layers. The experiments were performed at the radiometry laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY I. For photon energies below 150 eV, the total electron yield is proportional to the absorption coefficient, provided the saturation effects as determined here, by measurements of the TEY as a function of the angle of incidence of the radiation, are taken into account. At higher photon energy, the ratio between the TEY and the product of absorption coefficient times the photon energy decreases continuously by about 30% down to 1500 eV. We present a new analytical model for the total electron yield describing the contributions of primary and secondary electrons. Input parameters such as the electron escape depth and the reflection of the soft x-rays has been experimentally determined. When these parameters are used, our model achieves good agreement with the measured TEY, when the only free parameter, i.e., the efficiency with which the absorbed photon energy is converted into secondary electrons, is adjusted. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2207-2209 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Multilayer soft x-ray mirrors with an absorber consisting of the mixture Mo0.5Si0.5 have been fabricated by electron-beam evaporation in UHV. This has been done to get soft x-ray normal incidence mirrors for 80–100 eV photon energy with enhanced thermal stability and still high reflectivity. The thermal stability is studied by baking them at temperatures between 600 and 950 °C. The results were compared with multilayers of pure Mo and Si, which were also fabricated by electron-beam evaporation. After each baking step the x-ray mirrors are characterized by small angle CuKα x-ray diffraction. The reflectivity of the first-order Bragg peak is nearly constant up to 20 min baking at 900 °C. Further we present the normal incidence soft x-ray reflectivity for wavelengths between 12 and 18 nm of a Mo0.5Si0.5/Si mirror with 12 double layers (N=12) and of a Mo0.5Si0.5/Si mirror as deposited with 33 double layers (N=33). With the latter a reflectivity of 46% is achieved.
    Type of Medium: Electronic Resource
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