Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
82 (1997), S. 666-669
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
In this article an electron energy loss spectroscopy investigation of CNx thin films is reported. The bonding, composition, and structure are discussed and a more thorough extended energy loss spectroscopy investigation is carried out to determine the interatomic distances. The extended energy loss fine structure analysis reveals a component with an unusually high frequency in the data corresponding to an interatomic distance of approximately 7.3 Å. This is suggested to originate from backscattering from distant curved atomic layers. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.365596
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