Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
85 (1999), S. 5898-5900
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The perpendicular magnetic anisotropy (PMA) in NdFeB thin films is investigated. PMA was observed when the c axis of Nd2Fe14B phase orients perpendicular to the film plane. The c-axis orientation and hence the PMA was found to be very sensitive to composition and substrate temperature. The change of composition or substrate temperature leads to a deterioration in the c-axis orientation and PMA. However, the other parameters such as sputter power or deposition rate do not play a very important role over a wide range used in this study. Increasing the thickness of films does not cause a great deterioration of PMA up to 1500 nm, although the trend indicates that at higher values of thickness the films become isotropic. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.369907
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