Keywords:
Materials science.
;
Electronic books.
Description / Table of Contents:
This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
Type of Medium:
Online Resource
Pages:
1 online resource (558 pages)
Edition:
1st ed.
ISBN:
9780191004780
Series Statement:
Monographs on the Physics and Chemistry of Materials Series ; v.61
URL:
https://ebookcentral.proquest.com/lib/geomar/detail.action?docID=1192579
DDC:
530.41
Language:
English
Note:
Cover -- Contents -- 1 Basic concepts of high-energy electron diffraction -- 1.1 Introduction -- 1.2 The interaction between high-energy electrons and a solid -- 1.3 Elastic and inelastic scattering, and the complex potential -- 1.4 The amplitude and the differential cross-section of scattering of electrons -- 1.5 Elastic scattering by a time-independent potential - the one-body Schrödinger equation -- 1.6 Selected area electron diffraction (SAED), convergentbeam electron diffraction (CBED), and Kikuchi patterns -- 1.7 Scattering by time-dependent fluctuations of the potential -- 1.8 Damping of coherence in inelastic scattering and the validity of the optical potential -- 1.9 Relativistic corrections -- 1.10 Probability current density and conservation of probability -- 1.11 Correlation between theory and experiment -- 1.12 Summary -- 2 Kinematic theory -- 2.1 Introduction -- 2.2 Kinematic and quasi-kinematic diffraction theory -- 2.2.1 Kinematic diffraction -- 2.2.2 Quasi-kinematic diffraction -- 2.3 Scattering by a single atom -- 2.4 Amplitude of scattering by an assemblage of atoms -- 2.5 Diffraction by single crystals -- 2.6 Diffraction by a gas, an amorphous solid, and a liquid -- 2.7 Diffraction by polycrystals and textures -- 2.8 Fluctuation microscopy -- 2.9 Summary -- 3 Dynamical theory I. General theory -- 3.1 Introduction -- 3.2 Role of symmetry in dynamical diffraction -- 3.3 Forward and backward scattering -- 3.4 The multislice method -- 3.5 The general matrix method -- 3.5.1 Fundamental equations -- 3.5.2 The dispersion surface -- 3.5.3 Translation properties of Bloch waves -- 3.5.4 Boundary conditions and formal solutions -- 3.6 Summary -- 4 Dynamical theory II. Transmission high-energy electron diffraction -- 4.1 Introduction -- 4.2 Diffraction geometry -- 4.3 Basic concepts and the treatment of ZOLZ diffraction.
,
4.3.1 Basic equations and Bloch waves -- 4.3.2 Bound and free Bloch waves -- 4.3.3 Dispersion surfaces and band structure -- 4.3.4 Excitation of Bloch waves -- 4.3.5 Two and few Bloch wave approximations -- 4.3.6 Propagation of Bloch waves -- 4.3.7 Effects of absorption -- 4.4 The general treatment of THEED and HOLZ diffraction -- 4.4.1 Kinematic geometry of HOLZ diffraction -- 4.4.2 Formation of a HOLZ ring -- 4.4.3 Distribution of intensity in HOLZ patterns -- 4.4.4 General treatment of HOLZ diffraction -- 4.5 Summary -- 5 Dynamical theory III. Reflection high-energy electron diffraction -- 5.1 Introduction -- 5.2 Surface structure notation and RHEED geometry -- 5.2.1 The nature of the surface -- 5.2.2 The five surface nets -- 5.2.3 The relation between the surface mesh and the substrate mesh -- 5.2.4 Surface reciprocal lattice rods -- 5.3 RHEED theory -- 5.3.1 The THEED approach to RHEED -- 5.3.2 The semi-reciprocal formulation -- 5.3.3 The Green's function approach -- 5.3.4 The Bloch wave method -- 5.4 Worked examples -- 5.4.1 RHEED from the surface of a metal: the Ag(001) surface -- 5.4.2 RHEED from a surface of an ionic crystal: the NiO(001) and UO[sub(2)](111) surfaces -- 5.5 RHEED from growing surfaces: intensity oscillations -- 5.6 Summary -- 6 Resonance effects in transmission and reflection high-energy electron diffraction -- 6.1 The origin of resonances -- 6.2 Transmission resonance diffraction of high-energy electrons -- 6.2.1 The geometry of transmission resonance diffraction -- 6.2.2 Transmission resonance: a formal solution -- 6.2.3 Transmission resonance: diffraction via tightly bound states -- 6.3 Resonance diffraction from a crystal surface -- 6.3.1 The geometry of surface resonance scattering -- 6.3.2 The two-rod approximation -- 6.3.3 Resonance scattering via a surface state.
,
6.3.4 Resonance diffraction via localized bulk states -- 6.3.5 Interference between resonance and potential scattering -- 6.3.6 The time delay of the incident electron in the resonance state -- 6.4 Summary -- 7 Diffuse and inelastic scattering - Elementary processes -- 7.1 Diffuse and inelastic scattering -- 7.2 The distorted wave Born approximation -- 7.3 Diffuse scattering by point defects -- 7.4 The Van Hove dynamic form factor -- 7.5 Thermal diffuse scattering -- 7.6 Electron energy losses -- 7.6.1 Plasmons -- 7.6.2 Ionization of inner electronic shells -- 7.6.3 The extended energy loss fine structure (EXELFS) -- 7.7 Summary -- 8 Diffuse and inelastic scattering - Multiple scattering effects -- 8.1 Introduction -- 8.2 Breakdown of the DWBA and the optical potential model -- 8.3 Diffraction and multiple incoherent scattering of electrons -- 8.4 Kinetic equation for the density matrix -- 8.5 Loss of coherence due to multiple scattering by plasmons -- 8.6 Diffraction of diffusely scattered electrons: the formation of Kikuchi lines and bands -- 8.7 Kikuchi patterns in electron backscattering -- 8.8 Multiple diffuse scattering: an exact solution of the backscattering problem -- 8.9 Electron channelling patterns and channelling imaging of crystal defects -- 8.10 Diffraction effects in inner-shell ionization, X-ray, and Auger electron production -- 8.11 Summary -- 9 Crystal and diffraction symmetry -- 9.1 Introduction -- 9.2 Representation of symmetry -- 9.3 The reciprocity principle -- 9.4 Symmetry elements and their identification -- 9.5 Diffraction symmetry - a formal derivation -- 9.5.1 Basic solutions and relations -- 9.5.2 Effect of the space group symmetry -- 9.5.3 Diffraction groups and the symmetry of CBED patterns -- 9.5.4 Derivation of the fundamental symmetry relations -- 9.6 Crystal point group determination.
,
9.7 Crystal space group determination -- 9.7.1 Formation of G-M lines -- 9.7.2 Identification of G-M lines -- 9.7.3 Space group determination -- 9.8 Automated identification of CBED pattern symmetry -- 9.8.1 Genetic algorithm - basic concepts and implementation -- 9.8.2 Identification of CBED pattern symmetry -- 9.9 Summary -- 10 Perturbation methods and tensor theory -- 10.1 Introduction -- 10.2 Perturbation treatment of a periodic structure -- 10.2.1 Bloch waves, left-hand, and right-hand eigenvectors -- 10.2.2 Non-degenerate perturbation theory -- 10.2.3 First-order perturbation -- 10.2.4 Second-order perturbation -- 10.3 Tensor THEED -- 10.4 Direct inversion of THEED data -- 10.4.1 Inversion of crystal structure factors -- 10.4.2 Inversion of atomic coordinates -- 10.5 Perturbation methods for non-periodic structures -- 10.5.1 The DWBA treatment of diffraction by a non-periodic structure -- 10.6 Tensor RHEED and the direct inversion of a surface structure -- 10.7 Summary -- 11 Digital electron micrograph recording and basic processing -- 11.1 Introduction -- 11.2 Basic features of CCDs -- 11.3 A basic model of an SSC camera -- 11.4 Main characteristics of an SSC camera -- 11.4.1 The overall gain -- 11.4.2 Resolution and the point spread function -- 11.4.3 The detection quantum efficiency -- 11.5 The sampling theorem -- 11.6 Discrete and fast Fourier transform -- 11.6.1 Discrete Fourier transform -- 11.6.2 Fast Fourier transform (FFT) -- 11.7 Restoration of images -- 11.7.1 Generation of data points in reciprocal space -- 11.7.2 Generation of data points in real space -- 11.8 Summary -- 12 Image formation and the retrieval of the electron wave function -- 12.1 Introduction -- 12.2 Electron source and coherence -- 12.2.1 Partial coherence and the complex degree of coherence -- 12.2.2 Temporal coherence -- 12.2.3 Spatial coherence.
,
12.3 Image formation in an electron microscope -- 12.3.1 Transmission cross-coefficient (TCC) for coherent illumination -- 12.3.2 The TCC for incoherent illumination -- 12.3.3 The TCC for a partially coherent illumination -- 12.4 Exit electron wave function retrieval -- 12.4.1 Linear image retrieval -- 12.4.2 Non-linear image retrieval -- 12.5 Summary -- 13 The atomic scattering factor and the optical potential -- 13.1 Introduction -- 13.2 The optical potential -- 13.3 The averaged potential -- 13.3.1 Thermally averaged potential -- 13.3.2 Electron atomic scattering factor -- 13.3.3 Temperature factor -- 13.4 The absorptive potential -- 13.5 Computation of the complex structure factor -- 13.5.1 A worked example: strontium titanate -- 13.6 Analytical representation of atomic scattering factors -- 13.6.1 The parameterization of the elastic atomic scattering factor for electrons -- 13.6.2 Parameterization of the absorptive atomic scattering factor -- 13.7 Analytical expressions for the optical potential of atoms and crystals -- 13.8 Summary -- 14 Temperature-dependent Debye-Waller factors -- 14.1 Introduction and definitions -- 14.2 Debye-Waller factors of elemental crystals -- 14.3 Debye-Waller factors of cubic compounds -- 14.4 Summary -- A: Some useful mathematical relations -- A.1 Fourier transformation -- A.2 The Dirac delta function -- A.3 The Kronecker delta symbol -- A.4 Some useful integrals -- B: Green's functions -- C: FORTRAN listing of RHEED routines -- C.1 A FORTRAN routine for the calculation of U[sub(G)](z) -- C.1.1 The input file for the calculation of U[sub(G)](z) -- C.1.2 FORTRAN routine for calculating U[sub(G)](z) -- C.2 A FORTRAN routine for dynamical RHEED calculations -- C.2.1 Example input data file for dynamical RHEED calculations -- C.2.2 A FORTRAN routine for dynamical RHEED calculations.
,
D: Parameterization of the electron atomic scattering factor.
Permalink