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  • 1
    Online Resource
    Online Resource
    Oxford :Oxford University Press, Incorporated,
    Keywords: Materials science. ; Electronic books.
    Description / Table of Contents: This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
    Type of Medium: Online Resource
    Pages: 1 online resource (558 pages)
    Edition: 1st ed.
    ISBN: 9780191004780
    Series Statement: Monographs on the Physics and Chemistry of Materials Series ; v.61
    DDC: 530.41
    Language: English
    Note: Cover -- Contents -- 1 Basic concepts of high-energy electron diffraction -- 1.1 Introduction -- 1.2 The interaction between high-energy electrons and a solid -- 1.3 Elastic and inelastic scattering, and the complex potential -- 1.4 The amplitude and the differential cross-section of scattering of electrons -- 1.5 Elastic scattering by a time-independent potential - the one-body Schrödinger equation -- 1.6 Selected area electron diffraction (SAED), convergentbeam electron diffraction (CBED), and Kikuchi patterns -- 1.7 Scattering by time-dependent fluctuations of the potential -- 1.8 Damping of coherence in inelastic scattering and the validity of the optical potential -- 1.9 Relativistic corrections -- 1.10 Probability current density and conservation of probability -- 1.11 Correlation between theory and experiment -- 1.12 Summary -- 2 Kinematic theory -- 2.1 Introduction -- 2.2 Kinematic and quasi-kinematic diffraction theory -- 2.2.1 Kinematic diffraction -- 2.2.2 Quasi-kinematic diffraction -- 2.3 Scattering by a single atom -- 2.4 Amplitude of scattering by an assemblage of atoms -- 2.5 Diffraction by single crystals -- 2.6 Diffraction by a gas, an amorphous solid, and a liquid -- 2.7 Diffraction by polycrystals and textures -- 2.8 Fluctuation microscopy -- 2.9 Summary -- 3 Dynamical theory I. General theory -- 3.1 Introduction -- 3.2 Role of symmetry in dynamical diffraction -- 3.3 Forward and backward scattering -- 3.4 The multislice method -- 3.5 The general matrix method -- 3.5.1 Fundamental equations -- 3.5.2 The dispersion surface -- 3.5.3 Translation properties of Bloch waves -- 3.5.4 Boundary conditions and formal solutions -- 3.6 Summary -- 4 Dynamical theory II. Transmission high-energy electron diffraction -- 4.1 Introduction -- 4.2 Diffraction geometry -- 4.3 Basic concepts and the treatment of ZOLZ diffraction. , 4.3.1 Basic equations and Bloch waves -- 4.3.2 Bound and free Bloch waves -- 4.3.3 Dispersion surfaces and band structure -- 4.3.4 Excitation of Bloch waves -- 4.3.5 Two and few Bloch wave approximations -- 4.3.6 Propagation of Bloch waves -- 4.3.7 Effects of absorption -- 4.4 The general treatment of THEED and HOLZ diffraction -- 4.4.1 Kinematic geometry of HOLZ diffraction -- 4.4.2 Formation of a HOLZ ring -- 4.4.3 Distribution of intensity in HOLZ patterns -- 4.4.4 General treatment of HOLZ diffraction -- 4.5 Summary -- 5 Dynamical theory III. Reflection high-energy electron diffraction -- 5.1 Introduction -- 5.2 Surface structure notation and RHEED geometry -- 5.2.1 The nature of the surface -- 5.2.2 The five surface nets -- 5.2.3 The relation between the surface mesh and the substrate mesh -- 5.2.4 Surface reciprocal lattice rods -- 5.3 RHEED theory -- 5.3.1 The THEED approach to RHEED -- 5.3.2 The semi-reciprocal formulation -- 5.3.3 The Green's function approach -- 5.3.4 The Bloch wave method -- 5.4 Worked examples -- 5.4.1 RHEED from the surface of a metal: the Ag(001) surface -- 5.4.2 RHEED from a surface of an ionic crystal: the NiO(001) and UO[sub(2)](111) surfaces -- 5.5 RHEED from growing surfaces: intensity oscillations -- 5.6 Summary -- 6 Resonance effects in transmission and reflection high-energy electron diffraction -- 6.1 The origin of resonances -- 6.2 Transmission resonance diffraction of high-energy electrons -- 6.2.1 The geometry of transmission resonance diffraction -- 6.2.2 Transmission resonance: a formal solution -- 6.2.3 Transmission resonance: diffraction via tightly bound states -- 6.3 Resonance diffraction from a crystal surface -- 6.3.1 The geometry of surface resonance scattering -- 6.3.2 The two-rod approximation -- 6.3.3 Resonance scattering via a surface state. , 6.3.4 Resonance diffraction via localized bulk states -- 6.3.5 Interference between resonance and potential scattering -- 6.3.6 The time delay of the incident electron in the resonance state -- 6.4 Summary -- 7 Diffuse and inelastic scattering - Elementary processes -- 7.1 Diffuse and inelastic scattering -- 7.2 The distorted wave Born approximation -- 7.3 Diffuse scattering by point defects -- 7.4 The Van Hove dynamic form factor -- 7.5 Thermal diffuse scattering -- 7.6 Electron energy losses -- 7.6.1 Plasmons -- 7.6.2 Ionization of inner electronic shells -- 7.6.3 The extended energy loss fine structure (EXELFS) -- 7.7 Summary -- 8 Diffuse and inelastic scattering - Multiple scattering effects -- 8.1 Introduction -- 8.2 Breakdown of the DWBA and the optical potential model -- 8.3 Diffraction and multiple incoherent scattering of electrons -- 8.4 Kinetic equation for the density matrix -- 8.5 Loss of coherence due to multiple scattering by plasmons -- 8.6 Diffraction of diffusely scattered electrons: the formation of Kikuchi lines and bands -- 8.7 Kikuchi patterns in electron backscattering -- 8.8 Multiple diffuse scattering: an exact solution of the backscattering problem -- 8.9 Electron channelling patterns and channelling imaging of crystal defects -- 8.10 Diffraction effects in inner-shell ionization, X-ray, and Auger electron production -- 8.11 Summary -- 9 Crystal and diffraction symmetry -- 9.1 Introduction -- 9.2 Representation of symmetry -- 9.3 The reciprocity principle -- 9.4 Symmetry elements and their identification -- 9.5 Diffraction symmetry - a formal derivation -- 9.5.1 Basic solutions and relations -- 9.5.2 Effect of the space group symmetry -- 9.5.3 Diffraction groups and the symmetry of CBED patterns -- 9.5.4 Derivation of the fundamental symmetry relations -- 9.6 Crystal point group determination. , 9.7 Crystal space group determination -- 9.7.1 Formation of G-M lines -- 9.7.2 Identification of G-M lines -- 9.7.3 Space group determination -- 9.8 Automated identification of CBED pattern symmetry -- 9.8.1 Genetic algorithm - basic concepts and implementation -- 9.8.2 Identification of CBED pattern symmetry -- 9.9 Summary -- 10 Perturbation methods and tensor theory -- 10.1 Introduction -- 10.2 Perturbation treatment of a periodic structure -- 10.2.1 Bloch waves, left-hand, and right-hand eigenvectors -- 10.2.2 Non-degenerate perturbation theory -- 10.2.3 First-order perturbation -- 10.2.4 Second-order perturbation -- 10.3 Tensor THEED -- 10.4 Direct inversion of THEED data -- 10.4.1 Inversion of crystal structure factors -- 10.4.2 Inversion of atomic coordinates -- 10.5 Perturbation methods for non-periodic structures -- 10.5.1 The DWBA treatment of diffraction by a non-periodic structure -- 10.6 Tensor RHEED and the direct inversion of a surface structure -- 10.7 Summary -- 11 Digital electron micrograph recording and basic processing -- 11.1 Introduction -- 11.2 Basic features of CCDs -- 11.3 A basic model of an SSC camera -- 11.4 Main characteristics of an SSC camera -- 11.4.1 The overall gain -- 11.4.2 Resolution and the point spread function -- 11.4.3 The detection quantum efficiency -- 11.5 The sampling theorem -- 11.6 Discrete and fast Fourier transform -- 11.6.1 Discrete Fourier transform -- 11.6.2 Fast Fourier transform (FFT) -- 11.7 Restoration of images -- 11.7.1 Generation of data points in reciprocal space -- 11.7.2 Generation of data points in real space -- 11.8 Summary -- 12 Image formation and the retrieval of the electron wave function -- 12.1 Introduction -- 12.2 Electron source and coherence -- 12.2.1 Partial coherence and the complex degree of coherence -- 12.2.2 Temporal coherence -- 12.2.3 Spatial coherence. , 12.3 Image formation in an electron microscope -- 12.3.1 Transmission cross-coefficient (TCC) for coherent illumination -- 12.3.2 The TCC for incoherent illumination -- 12.3.3 The TCC for a partially coherent illumination -- 12.4 Exit electron wave function retrieval -- 12.4.1 Linear image retrieval -- 12.4.2 Non-linear image retrieval -- 12.5 Summary -- 13 The atomic scattering factor and the optical potential -- 13.1 Introduction -- 13.2 The optical potential -- 13.3 The averaged potential -- 13.3.1 Thermally averaged potential -- 13.3.2 Electron atomic scattering factor -- 13.3.3 Temperature factor -- 13.4 The absorptive potential -- 13.5 Computation of the complex structure factor -- 13.5.1 A worked example: strontium titanate -- 13.6 Analytical representation of atomic scattering factors -- 13.6.1 The parameterization of the elastic atomic scattering factor for electrons -- 13.6.2 Parameterization of the absorptive atomic scattering factor -- 13.7 Analytical expressions for the optical potential of atoms and crystals -- 13.8 Summary -- 14 Temperature-dependent Debye-Waller factors -- 14.1 Introduction and definitions -- 14.2 Debye-Waller factors of elemental crystals -- 14.3 Debye-Waller factors of cubic compounds -- 14.4 Summary -- A: Some useful mathematical relations -- A.1 Fourier transformation -- A.2 The Dirac delta function -- A.3 The Kronecker delta symbol -- A.4 Some useful integrals -- B: Green's functions -- C: FORTRAN listing of RHEED routines -- C.1 A FORTRAN routine for the calculation of U[sub(G)](z) -- C.1.1 The input file for the calculation of U[sub(G)](z) -- C.1.2 FORTRAN routine for calculating U[sub(G)](z) -- C.2 A FORTRAN routine for dynamical RHEED calculations -- C.2.1 Example input data file for dynamical RHEED calculations -- C.2.2 A FORTRAN routine for dynamical RHEED calculations. , D: Parameterization of the electron atomic scattering factor.
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2311-2312 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Void-like defects of octahedron structure having {111} facets were observed in annealed Czochralski silicon. The amorphous coverage of SiOx and SiCx on the inner surface of the defects was identified using transmission electron microscopy and electron energy-loss spectroscopy. It is suggested that these defects are a kind of amorphous precipitate origin. A mechanism for the generation of these defects and the previously reported solid amorphous precipitates is proposed. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 771-773 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method is proposed for the accurate measurement of phase shift in electron holography. The method is based on the use of moiré fringes resulting from the subtraction of a null electron hologram by a real object hologram recorded under slightly different experimental conditions. This method does not require any optical or digital reconstruction of the electron hologram, and is shown to be highly sensitive to the phase shift of the electron wave passing through an object. Using experimental results obtained from a single particle of silicon, we demonstrate that the sensitivity of this method to phase shift may easily be amplified by more than 11 times compared with the conventional method using an ordinary electron hologram. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 3702-3704 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Well crystallized nanoscale tubular materials have been synthesized via the reaction of TiO2 crystals of either anatase or rutile phase and NaOH aqueous solution. The atomic structure of the synthesized tubular material is imaged by high-resolution transmission electron microscopy (HRTEM), and the composition of individual tubular structures is determined using selected area energy dispersive X-ray spectroscopy (EDX). Our results show that the tubular materials are well crystallized tubes with an average diameter of about 9 nm and little dispersion, and are composed of mainly titanium and oxygen. The atomic ratio of O/Ti is found, however, to vary from tube to tube. Detailed electron and x-ray diffraction studies show that the structure of our titanium oxide nanotubes do not agree with those made of TiO2 crystals with either anatase or rutile phase. HRTEM observations revealed that the titanium oxide nanotubes usually have multiple shells, in analogy with multiwalled carbon nanotubes, but the shell spacing is about 0.75 nm which is much larger than that of the carbon nanotube, and the atomic structures of different shells are well correlated. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Ultramicroscopy 32 (1990), S. 169-175 
    ISSN: 0304-3991
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Ultramicroscopy 45 (1992), S. 405-409 
    ISSN: 0304-3991
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 1-6 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The Mott formula relating the electron scattering factor to that for X-rays is inaccurate in its numerical form in the small-angle region. Effects of the inaccuracy on both kinematic and dynamical diffraction have been investigated. Some artifacts arising from the inaccuracy have been found in simulated electron microscopy images. A modified form for the Mott formula, which minimizes the error, is proposed. However, for any accurate and reliable calculation only those electron scattering factors derived directly from the atomic potential can be used.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 42 (1986), S. 545-552 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The multislice formulation of the many-beam dynamical diffraction theory has been applied to the Bragg case of electron diffraction for the extended surface of a perfect crystal and also for a crystal surface with a surface step. The wavefunctions within and outside the crystal have been calculated and used to derive the standing-wave pattern in the top atomic layers of the crystal, the intensities of the reflection high-energy electron diffraction (RHEED) pattern and the contrast of the reflection electron microscopy (REM) image. Calculations made for the diffraction of 19, 40 and 80 keV electrons from (111) surfaces of Pt and Au demonstrate the channeling of electrons under the conditions of surface resonance, the perturbation of the standing-wave field in the crystal by a one-atom-high surface step and the REM contrast for a through-focus series of images of a surface step. The method is applicable to models including surface relaxations and reconstructions and any kind of local defect of the surface or of the bulk crystal.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 47 (1991), S. 101-109 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A Bloch-wave analysis is made of the problem of uncoupling surface superlattice reflections from fundamental reflections in transmission electron diffraction (TED) analysis of reconstructed surfaces. This uncoupling problem is proved to be of crucial importance in determining the structure of reconstructed surfaces, for example the Si(111) 7 × 7 surface [Takayanagi, Tanishiro, Takahashi & Takahashi (1985). Vac. Sci. Technol. A3, 1502–1506; (1985). Surf Sci. 164, 367–392]. It is found that a complete uncoupling, weak coupling and sometimes strong coupling between the bulk scattering and surface superlattice scattering are all possible depending on the diffraction conditions. For a kinematical analysis of reconstructed surfaces to be valid, a weak coupling or a complete uncoupling condition must be realised. General rules for choosing the appropriate diffraction conditions are given.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 50 (1994), S. 759-771 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The validity of the direct phasing and Fourier method for direct crystal structure determination is examined. It is shown that, while the kinematic approximation for electron diffraction is not strictly valid for all materials containing heavy atoms in real space, many of the low-order diffracted beams behave kinematically for a small crystal thickness. For thin crystals, structure maps constructed from compound crystals containing heavy atoms using low-order reflections are found to be faithful representations of the crystal structures. The inclusion of high-order diffracted beams is shown, however, to introduce intensity maxima that do not coincide with atom positions. It is shown that, if dynamical phases of the diffracted beams are available, as in the case of electron holography, an electron-density map using dynamical phases is a better map of the crystal structure than the structure map constructed using kinematic phases.
    Type of Medium: Electronic Resource
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