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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 3375-3377 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the effect of He+ irradiation on the electrical resistivity and Curie temperature of ferromagnetic SrRuO3 thin films. An evolution from metallic to insulating behavior is observed when He+ ion fluence is increased, suggesting a metal–insulator transition. Damage by ion irradiation produces a strong decrease of the Curie temperature. On the other hand, no significant change in Tc (∼160 K) takes place in fresh samples grown at different substrate temperatures. We discuss the possible correlation between structural changes induced by irradiation, which reflect in an increase of the pseudocubic lattice parameter, and the observed depression of Tc.© 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied the effect of He+ irradiation with doses in the range 1012–2×1015 cm−2 on two high-temperature superconducting structures: YBa2Cu3O7−x (YBCO) films and YBa2Cu3O7−x/PrBa2Cu3O7 (YBCO/PBCO) superlattices. In particular we have focused on superlattices [YBCON/PBCOM]1000 Å with N=1, 8 unit cells of YBCO, and M=5 unit cells of PBCO, with a total thickness of 1000 Å. The analysis is presented in terms of depression of the critical temperature (Tc) and modification of the crystalline structure using X ray refinement technique. Single films show a systematic increase in the c-lattice parameter upon irradiation, which is not observed in thin one unit cell YBCO layers in superlattice structures. However, Tc depression resulting from irradiation is deeper in superlattices. These results are explained considering the strained nature of the as-grown [YBCON/PBCO5]1000 Å superlattices with low values of N. Both structures show persistent photoconductivity, indicating that defects are related to oxygen displacements in the Cu–O chains. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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