Note: Front Cover -- Problems and Solutions for Students -- Copyright Page -- Contents -- Contributors to Volume 8 -- Foreword -- Chapter 1. The Theoretical Limit for the Detectability of a Signal -- Chapter 2. Low Frequency Loudspeaker Design -- Chapter 3. Temperatures below 4.2°K -- Chapter 4. Reflectivity Measurement -- Chapter 5. Calibration of a Spectroscopic System -- Chapter 6. Visibility of Young's Interference Fringes -- Chapter 7. Field of Line Currents -- Chapter 8. Field of a Circular Loop -- Chapter 9. Dipole Fields -- Chapter 10. Fields Due to Magnetized Dipoles -- Chapter 11. Magnetic Fields of a Current Loop -- Chapter 12. Pair of Current Loops -- Chapter 13. Field of a Solenoid of Finite Cross-Sectional Area -- Chapter 14. Field of a Pair of Solenoids -- Chapter 15. Broad Band Impedance Matching -- Chapter 16. Balun and Narrow Band Impedance Matching -- Chapter 17. Measurement of Pulsed Microwave Power -- Chapter 18. Microwave Cavity Resonator -- Chapter 19. Coupling of a Microwave Cavity to a Waveguide -- Chapter 20. Phase Shifter -- Chapter 21. Waveguide Interferometer -- Chapter 22. Microwave Optics -- Chapter 23. Measurement of Gravitational Red Shift -- Chapter 24. Relativistic Effect on Atomic Clocks -- Chapter 25. Electron Storage Ring -- Chapter 26. Mass Spectrometer for Upper Atmosphere Research -- Chapter 27. Mass Spectrometer for Reactor Fuel Research -- Chapter 28. Isotope Separator -- Chapter 29. Half-Life of N13 -- Chapter 30. Nuclear Counting Experiments -- Chapter 31. Gamma Spectroscopy -- Chapter 32. Spectrometer Comparison -- Chapter 33. Pair Production Cross Section -- Chapter 34. Reactivity Oscillator -- Chapter 35. Neutron Transmission Measurements -- Chapter 36. Fuel Irradiation Capsule -- Chapter 37. Reactor Regulation and Control -- Chapter 38. Isochronous Reaction Surfaces. , Chapter 39. Neutron Threshold Measurements -- Chapter 40. Experimental Targetry -- Chapter 41. Dynamics of Mass Exchange Reactions.

Note: Cover -- Contents -- Contributors to Volume 54 -- Foreword -- Chapter 1. Magnetic Reconnection Experiments -- I. Prolog -- II. Introduction -- III. Historical Perspective Prior to 1970 -- IV. Reconnection Theory -- V. Reconnection Experiments -- VI. Discussion and Conclusions -- Appendix I. A Simple Example of an X Point -- Appendix II. Reconnection Jargon -- Appendix III. Impulsive Flux Transfer and Circuit Transients -- References -- Chapter 2. Electron Physics in Device Microfabrication. II Electron Resists, X-Ray Lithography, and Electron Beam Lithography Update -- I. Introduction -- II. Interactions between a Focused Electron Beam and a Resist-Covered Wafer -- III. X-Ray Lithography -- IV. Recent Work in Electron Beam Lithography -- V. The Relative Roles of X-Ray and Electron Beam Lithography Systems with High Throughput -- References -- Chapter 3. Solar Physics -- I. Introduction -- II. The Solar Interior -- Ill. The Quiet Solar Atmosphere -- IV. Solar Activity -- References -- Chapter 4. Aspects of Resonant Multiphoton Processes -- I. Introduction -- II. Formal Theory of Multiphoton Processes -- III. The Quantum Theory of Resonant Two-Photon Processes -- IV. The Effect of Nonresonant States -- V. Higher-Order Processes -- VI. Semiclassical Approaches -- VII. Multiple Resonances -- VIII. Field Statistics and Bandwidth Effects -- IX. Experimental Investigations of Resonant Multiphoton Processes -- References -- Chapter 5. Fundamentals and Applications of Auger Electron Spectroscopy -- I. Introduction -- II. Fundamentals -- III. Experimental Approach -- IV. Quantitative AES -- V. Sample Damage -- VI. Applications -- VII. Summary -- References -- Author Index -- Subject Index.

Note: Front Cover -- Electron Probe Microanalysis -- Copyright Page -- Table of Contents -- LIST OF CONTRIBUTORS -- FOREWORD -- Chapter 1. Survey of Microanalysis-Interpolation and Extrapolation -- Text -- References -- Chapter 2. Behavior of Electrons in a Specimen -- I. Introduction -- II. Backscattering and Diffusion of Electrons -- III. Spot Size of Diffused X-Ray Source and Depth Distribution of Characteristic X-Ray -- IV. Resolving Power of Electron Microprobe -- V. Application of Backscattered Electron and Specimen Current Methods -- References -- Chapter 3. The Sandwich Sample Technique Applied to Quantitative Microprobe Analysis -- I. Introduction -- II. The Absorption Correction -- III. Fluorescence Due to Characteristic Lines -- IV. The Atomic Number Effect -- V. A Model for Quantitative Electron Probe Microanalysis -- References -- Chapter 4. Quantitative Microprobe Analysis: A Basis for Universal Atomic Number Correction Tables -- I. Introduction -- II. Formulation of Atomic Number Correction -- III. Discussion and Evaluation of the Correction Formula -- IV. Basis for Universal Correction Tables -- V. Application to Experimental Data -- VI. Summary and Conclusions -- Appendix I. Tabulation of λ' Values -- Appendix II. Example Calculation Using Universal Atomic Number Correction Tables -- Appendix III. Mass Absorption Coefficients -- Appendix IV. Mass Absorption Coefficients -- References -- Chapter 5. Deconvolution: A Technique to Increase Electron Probe Resolution -- Summary -- I. Introduction -- II. Theory of the Deconvolution Method -- III. Mathematics of the Deconvolution Method -- IV. Experimental Measurements -- V. Reduction of Data -- VI. Discussion -- References -- Chapter 6. Analysis for Low Atomic Number Elements with the Electron Microprobe -- I. Introduction -- II. The Stearate Crystal -- III. Reduction of Carbon Contamination. , IV. Analysis of the Light Elements -- References -- Chapter 7. Changes in X-Ray Emission Spectra Observed between the Pure Elements and Elements in Combination with Others to Form Compounds or Alloys -- I. Introduction -- II. X-Ray Emission Spectra -- III. Applications -- References -- Chapter 8. Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis -- I. Introduction -- II. Qualitative Considerations -- III. Experimental Techniques -- IV. Quantitative Analysis -- V. Scanning Images -- References -- Chapter 9. The Influence of the Preparation of Metal Specimens on the Precision of Electron Probe Microanalysis -- I. Introduction -- II. Problems in Specimen Preparation -- III. Effects of Surface Roughness -- IV. Effects of Leaching, Deposition, Smearing, and Etching -- V. Effects of Anodic or Vapor Deposited Films -- VI. Conclusions -- References -- Chapter 10. Electron Probe Microanalysis in Mineralogy -- I. Introduction -- II. Sample Preparation -- III. Problems Inherent in Mineral Analysis -- IV. Qualitative Analysis of Minerals -- V. Quantitative Analysis of Minerals -- VI. Examples of Electron Probe Analysis in Mineralogy -- VII. Future Trends -- VIII. Conclusions -- References -- Chapter 11. Electron Probe Analysis in Metallurgy -- I. Introduction -- II. Applications in Metallography -- III. Kinetic Processes -- IV. Conclusion -- References -- Chapter 12. Scanning Electron Probe Measurement of Magnetic Fields -- I. Introduction -- II. Basic Description of the Method -- III. Magnetic Field Calculation -- IV. Angular Deflection of Secondaries -- V. Detected Signal Due to Magnetic Field -- VI. Detected Signal Due to Surface Relief -- VII. Other Limitations -- VIII. Description of Detector -- IX. Specimen Preparation -- X. Measurement Techniques, Results and Discussion -- XI. Image Displays. , XII. Conclusions -- Appendix I. Other Detector Applications -- Appendix II. Specimen and Collector Currents under Bias Conditions -- Appendix III. Magnetic Signal under Bias Conditions -- References -- Chapter 13. Nondispersive X-Ray Emission Analysis for Lunar Surface Geochemical Exploration -- I. Introduction -- II. Data Analysis -- III. Application of Least-Square Technique to an Experimental Problem -- References -- Chapter 14. The Divergent Beam X-Ray Technique -- List of Symbols -- I. Introduction -- II. Early Work -- III. Formation of the Observed X-Ray Conic Sections -- IV. Pattern Interpretation -- V. Orientation of Crystals by Means of the Kossel Technique -- VI. Use of the Kossel Technique to Study Mechanical and Thermodynamic Characteristics of Crystals -- VII. Experimental Methods in Divergent Beam Diffraction -- VIII. Contribution of Divergent Beam X-Ray Diffraction to Scientific Research -- References -- AUTHOR INDEX -- SUBJECT INDEX.

Note: Front Cover -- Computer Techniques for Image Processing in Electron Microscopy -- Copyright Page -- Table of Contents -- Foreword -- Preface -- Chapter 1. Image Formation Theory -- 1.1 ELECTRON OPTICS -- 1.2 BEAM-SPECIMEN INTERACTION -- 1.3 LINEAR IMAGING -- 1.4 NONLINEAR IMAGING -- 1.5 IMAGE ANALYSIS AND OBJECT RECONSTRUCTION -- 1.6 RESOLUTION, CONTRAST, NOISE, AND RADIATION DAMAGE -- Chapter 2. The Discrete Fourier Transform -- 2.1 DEFINITION AND FUNDAMENTAL PROPERTIES -- 2.2 APPROXIMATION OF INTEGRAL TRANSFORMS -- 2.3 MULTIDIMENSIONAL FORMS -- Chapter 3. Analytic Images -- 3.1 COMPLEX ZEROS -- 3.2 ZERO FLIPPING -- 3.3 PERIODIC IMAGES -- 3.4 TWO-DIMENSIONAL FORMS -- 3.5 THE ONE-SIDED DIFFRACTION PLANE CONSTRAINT -- 3.6 LOGARITHMIC HILBERT TRANSFORMS -- 3.7 THE REALIZABILITY OF THE ONE-SIDED CONSTRAINT -- 3.8 LOGARITHMIC HILBERT TRANSFORMS IN DARK-FIELD CONDITIONS -- Chapter 4. The Image and Diffraction Plane Problem: Uniqueness -- 4.1 STATEMENT OF THE PROBLEM -- 4.2 DATA CONSTRAINTS AND TRIVIAL UNIQUENESS FAILURES -- 4.3 AN IMPORTANT FAILURE OF UNIQUENESS -- 4.4 THE CONTINUOUS APERIODIC PROBLEM -- 4.5 THE PERIODIC AND DISCRETE PROBLEMS -- 4.6 SUMMARY -- Chapter 5. The Image and Diffraction Plane Problem: Numerical Methods -- 5.1 DIRECT METHODS -- 5.2 STEEPEST DESCENT METHODS -- 5.3 THE ITERATIVE TRANSFORM METHOD -- APPENDIX A5 -- Chapter 6. The Image and Diffraction Plane Problem: Computational Trials -- 6.1 REAL PROBLEMS AND MATHEMATICAL MODELS -- 6.2 THE STEEPEST DESCENT METHOD -- 6.3 THE ITERATIVE FOURIER TRANSFORM METHOD -- 6.4 THE MATRIX INVERSION METHOD -- Chapter 7. Alternative Data for the Phase Determination -- 7.1 DEFOCUS PAIRS -- 7.2 BRIGHT-FIELD/DARK-FIELD DIFFRACTION PATTERN SETS -- 7.3 FURTHER POSSIBLE DATA -- 7.4 AN ASSESSMENT OF PHASE DETERMINATION -- Chapter 8. The Hardware of Digital Image Handling. , 8.1 OPTICAL OR DIGITAL MANIPULATION ? -- 8.2 DIGITIZATION AND REGENERATION -- 8.3 PROCESSORS, REPRESENTATION, AND STORAGE -- Chapter 9. Basic Software for Digital Image Handling -- 9.1 A PROCESSING SYSTEM -- 9.2 INPUT, OUTPUT, AND DATA SELECTION -- 9.3 TRANSFORMATION -- 9.4 CORRELATION AND LATERAL ALIGNMENT -- 9.5 ALIGNMENT IN ORIENTATION AND MAGNIFICATION -- 9.6 AVERAGING REPEATED STRUCTURES -- 9.7 OBJECT RECONSTRUCTION -- Chapter 10. Improc -- 10.1 THE OBJECTIVES AND ENVIRONMENT -- 10.2 THE IMPLEMENTATION TECHNIQUE -- 10.3 THE LANGUAGE STRUCTURE -- 10.4 SPECIMEN PROGRAMS -- 10.5 THE IMPROC MACRO DEFINITIONS -- 10.6 RECENT EXTENSIONS -- APPENDIX A10 -- References -- Index.