Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
59 (1988), S. 2508-2509
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A review article in the October 1987 issue of the Review of Scientific Instruments entitled: "Mass analyzed secondary ion microscopy,'' by Mark T. Bernius and George H. Morrison, contains a number of incorrect statements and quotations that must be rectified. A table comparing the UC scanning ion microprobe and the Cornell stigmatic ion microscope is presented.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139891
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