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  • 1
    Electronic Resource
    Electronic Resource
    Equipment for in situ resistivity and x-ray diffraction studies during ion implantation at temperatures between 4 K and 1270 K (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3961-3964 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An instrument is presented which was designed for comprehensive in-situ analysis of phase formation and transformation during the ion implantation process. An implanter end station with heatable He-cryostat as a sample holder was built. A temperature range from 4 to 1270 K is covered by the sample holder so that temperature can be varied during implantation or subsequent annealing in high vacuum. Both x-ray diffraction and four-point resistivity measurement are installed as in-situ investigation techniques. In this way a detailed study of structural changes and defect kinetics during ion bombardment is now possible. The whole instrument has been successfully tested. Examples of carbon ion implantation in titanium and iron are given. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147299
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Dissipative flux motion in YBa2Cu3O7−δ films — Investigation by means of transport I-V curves (1993)
    Springer
    The European physical journal 92 (1993), S. 163-172 
    Details
    ISSN: 1434-6036
    Keywords: 74.60Ge ; 74.76Bz ; 61.80Jh
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The nature of dissipative flux motion in epitaxial YBa2Cu3O7−δ thin films has been investigated by means of resistivity ϱ(T, B) and transport current-voltage characteristicsE(j, T, B) covering up to 5 orders of magnitude in voltage for a wide range of temperatures (4.2–85 K) and magnetic fields (0.5–7.0 T). Activation energiesU(T, B, j) have been determined in the framework of the collective flux creep theory. It is shown thatU(T, B, j) decreases with increasing temperature, magnetic field and current density. In order to study the influence of a well-defined defect structure, columnar defects have been generated by irradiation with 340 MeV Xe-ions. From a scaling law relating theI–V curves after irradiation with the curves before irradiation it is found that vortices pinned by the columnar defects do not contribute to dissipation. Due to irradiation the irreversibility line is shifted to higher magnetic fields, indicating its connection to the pinning mechanisms present in the samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01312172
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Viskositätsmessungen an Gußeisenschmelzen (1958)
    Springer
    Rheologica acta 1 (1958), S. 32-38 
    Details
    ISSN: 1435-1528
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Zusammenfassung Es wird ein Viskosimeter zur Messung von Gußeisenschmelzen bis zu 1400°C aus dem Rotationsviskosimeter Bauart MPA und der dazu erforderliche keramische Drehkörper bezüglich Form und Material entwickelt. Dieses Viskosimeter kann für Kontrollmessungen im Gießereibetrieb eingesetzt werden, da es durch die elektrische Fernanzeige möglich ist, die feinen Meßinstrumente in größerer Entfernung von der eigentlichen Meßstelle aufzubauen und sie vor den Einflüssen des rauhen Betriebes zu schützen. Es wird für diese Temperaturbereiche eine völlig neue Methode beschrieben, die sich von den bisherigen Messungen vonP. Oberhoffer undA. Wimmer (4) nach der Torsionsmethode und Messungen vonH. Thielmann undA. Wimmer (5) nach der Schwingtiegelmethode an weißem Gußeisen dadurch unterscheidet, daß während der Messung keine Temperaturkonstanz angestrebt zu werden braucht, da die einzelne Messung kein Zeitintervall erfordert und die dazugehörige Temperatur exakt bestimmt werden kann. Leider können die hier erhaltenen Ergebnisse nicht mit den Messungen vonOberhoffer undWimmer verglichen werden, da die Verfasser keine absoluten Werte angeben. Bei den Messungen vonThielmann undWimmer handelt es sich um weißes Gußeisen, das auf Grund unterschiedlicher Siliziumgehalte gegenüber Grauguß nicht vergleichbar mit den gefundenen Ergebnissen ist.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01982281
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    Paper (German National Licenses)
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