ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
An analysis of transverse cracks induced in brittle coatings on soft substrates by spherical indenters is developed. The transverse cracks are essentially axisymmetric and geometrically conelike, with variant forms dependent on the location of initiation: outer cracks that initiate at the top surface outside the contact and propagate downward; inner cracks that initiate at the coating/substrate interface beneath the contact and propagate upward; intermediate cracks that initiate within the coating and propagate in both directions. Bilayers consisting of hard silicon nitride (coating) on a composite underlayer of silicon nitride with boron nitride platelets (substrate), with strong interfacial bonding to minimize delamination, are used as a model test system for Hertzian testing. Test variables investigated are contact load, coating/substrate elastic-plastic mismatch (controlled by substrate boron nitride content), and coating thickness. Initiation of the transverse coating cracks occurs at lower critical loads, and shifts from the surface to the interface, with increasing elastic-plastic mismatch and decreasing coating thickness. This shift is accompanied by increasing quasi-plasticity in the substrate. Once initiated, the cracks pop in and arrest within the coating, becoming highly stabilized and insensitive to further increases in contact load, or even to coating toughness. A finite element analysis of the stress fields in the loaded layer systems enables a direct correlation between the damage patterns and the stress distributions: between the transverse cracks and the tensile (and compressive) stresses; and between the subsurface yield zones and the shear stresses. Implications of these conclusions concerning the design of coating systems for damage tolerance are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1151-2916.1998.tb02376.x
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