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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 2995-3000 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin amorphous Si3N4 films grown on Si are studied with the near-edge x-ray absorption fine structure (NEXAFS) characterization technique. The N dangling bonds in N-rich films give rise to a strong resonance line (RL) at the onset of the N 1s absorption edge, with an intensity that increases with the N/Si ratio. Further evidence on the origin of the RL is provided by the NEXAFS spectra from nitrogen-implanted Si and Si3N4 films bombarded with Ar+ ions. The RL can be annealed out after annealing at temperatures higher than the growth temperature. We propose that the annealing of the RL is due to formation of Si—N bonds, where the Si atoms are provided by the stressed interface. The velocity of the annealing process is controlled by the diffusivity of Si interstitials in the Si3N4 and the process is characterized by an activation energy of 0.86 eV.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2485-2489 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: To satisfy the increasing need for research using circularly polarized x rays we present a compact prototype of a polarization detector based on magnetic circular dichroism (MCD) in bulk transmission using a multilayer at grazing incidence as bandpass filter. The detector features reliability, heat load stability, and for Fe-MCD a polarization sensitivity from 700 to 740 eV. The technique can be easily extended to the L edges of other 3d transition elements giving rise to other energy ranges by just tuning the incidence angle and changing the material of the transmission foil. The detector calibration was made using off plane bend magnet radiation at the BESSY I storage ring and it turns out that the polarization degree of an unknown source can be well detected within a 3% error rms. The detector dimensions are less than 10 cm and only modest vacuum conditions are required. Once calibrated in white light, it can be used to determine the degree of circular polarization behind monochromators, insertion devices as well as in polychromatic light with up to 100 Hz repetition rate without any rotation of its components. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5090-5090 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: During the past few years the magnetic circular dichroism effect (MCD) has become an increasingly important tool for studying magnetic materials and their surfaces. The employment of MCD is based on the use of circularly polarized soft x rays, which can be obtained from electron storage rings. Circularly polarized x rays appear either as off-plane bending magnet radiation or radiation from special undulator devices, e.g., crossed or helical ones. However, an unsolved problem has been the independent and simple measurement of the polarization of this radiation. At BESSY, we have developed a new compact polarimeter. The instrument consists of four major elements. There are (i) a pinhole to select the desired part of the photon emission cone and (ii) a 100-period Cr/C multilayer to serve as a monochromator with a spectral resolution power of 50. The angle of incidence is set to 15.9° to meet 718 eV photon energy that corresponds to a maximum MCD effect close to the Fe 2p threshold excitation energy. There are also (iii) a 50 nm Fe film on 3 μm Mylar foil to show the MCD effect in photon transmission (the foil is mounted under 45° to the photon beam and can be magnetized in the plane of the Fe film) and (iv) a Si-pin diode to measure the transmitted photon flux. The assembly fulfills the following requirements: (1) insensitive to linearly polarized and unpolarized light, (2) performance at high heat load, (3) reliability and long term stability also in air, (4) wavelength sensitivity, and (5) fast readout capability. In future work the polarimeter can be employed for the characterization of helical undulators such as the BESSY II UE56, which cover the range of the Fe 2p threshold. With foils of other transition metal or rare-earth materials, the sensitive photon energy range can be extended.© 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3367-3367 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: X-ray optical systems based on Bragg-Fresnel multilayer components imaging an electron beam in a storage ring with μm resolution are presented. Design concepts are compared to alternative methods, and the aberrations and limits of Bragg-Fresnel multilayer optics are discussed. Experimental results of imaging the BESSY I source with sub-10-μm resolution are presented, and the development of a compact Bragg-Fresnel multilayer telescope as a BESSY II standard beam monitor is described. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1889-1891 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Commercial position sensitive diodes which were designed for measurements with visible light have been used to measure beam position in a white-light beamline, exposing them to the hard-x-ray part of the dipole spectrum. In preliminary studies it was found that the quantum efficiency of the lateral diodes is comparable to that of Si XUV diodes. At 1.5 keV a quantum efficiency of about 100 electrons per photon was measured in the central position. No long-term drifts of the efficiency have been observed. The position sensitivity of the diodes is almost independent of photon energy, but is at least a factor of 2 higher than in the visible range. Hence in a white-light beam, a photon energy window was defined by a water-cooled Al-absorber foil of 200 μm thickness. Behind the foil two lateral diodes were arranged at 3.5 (15 mm length) and 7 m (30 mm length) behind the source. The horizontal position of the diodes was staggered so that the first diode does not occlude the beam to the second one. With this system, the vertical source position in a bending magnet can be detected with 10 μm accuracy while the emission angle can be detected down to values of 2 μrad. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 655-657 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic circular dichroism in resonant photoemission combined with a space resolving photoelectron spectrometer has been applied to measure magnetic domain structures with a spatial resolution of ≈10 μm. The tunability of the photon energy and the kinetic energy of photoelectrons provides a high degree of element specifity and magnetic contrast. We have applied the technique to 1 monolayer Gd on Fe(100) which allowed to measure magnetic domains in the Gd overlayer independently from the domains of the Fe substrate. Due to the antiferromagnetic coupling between Fe and Gd and because of the element specifity we could observe inverted domain images for the substrate and the overlayer.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2432-2434 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic domains on an Fe(100) surface have been imaged by means of energy-resolved photoemission microscopy. We excited the photoelectrons with circularly polarized synchrotron radiation in the soft x-ray region, and employed the effect of magnetic circular dichroism in the emitted photoelectrons in order to obtain contrast between differently oriented magnetic domains. This new approach offers a surface sensitive way to combine chemical and magnetic information on a microscopic scale.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Analytica Chimica Acta 297 (1994), S. 125-138 
    ISSN: 0003-2670
    Keywords: Electron spectroscopy for chemical analysis ; Surface techniques ; x-ray photoelectron microscopy
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of molecular medicine 34 (1956), S. 1268-1271 
    ISSN: 1432-1440
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Journal of molecular medicine 38 (1960), S. 953-954 
    ISSN: 1432-1440
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Type of Medium: Electronic Resource
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