Publication Date:
2012-06-20
Description:
Author(s): A. Auge, N. Teichert, M. Meinert, G. Reiss, A. Hütten, E. Yüzüak, I. Dincer, Y. Elerman, I. Ennen, and P. Schattschneider We investigate the influence of the film thickness on the martensitic transformation for the example of Ni-Mn-Sn thin films. Epitaxial films with thicknesses ranging from 100 nm down to 10 nm were deposited on MgO by co-sputtering on heated substrates. The martensitic transformation is investigated ... [Phys. Rev. B 85, 214118] Published Tue Jun 19, 2012
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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