GLORIA

GEOMAR Library Ocean Research Information Access

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 5926-5935 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Oxygen (O) and carbon (C) coprecipitation in Czochralski Si is studied in terms of a diffusion-limited growth model. The interfacial energy increase upon C incorporation into oxide precipitates as well as the changes of O and C concentrations in the Si matrix with annealing time have been taken into account. A comparison of the model predictions with available experimental data has led to the following conclusions: (i) Regardless of the C content in the crystal, it is necessary to introduce sinks for the precipitation-induced excess Si self-interstitials (I) in the matrix for high annealing temperatures. (ii) At annealing temperatures below about 1000 °C, the enhancement effect of C on O precipitation results primarily from an increase in the precipitate density. (iii) The transition in the C precipitation behavior observed in C-rich Si crystals at annealing temperatures around 800 °C is related to a change in the availability of effective I sinks in the Si matrix at these temperatures. (iv) An enhancement of C diffusivity in the presence of excess I plays an important role in increasing the precipitate growth rate, particularly at low temperatures for which no efficient I sinks are available in the Si matrix. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 5563-5571 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The partitioning of point defect species during diffusion controlled precipitation of a misfitting compound in Czochralski silicon is studied using the principle of maximum degradation rate of the total system free energy. The degradation rate of the system free energy is obtained from the entropy production due to mass diffusion in the matrix. The results are then compared with those obtained using the principle of maximum growth rate. It is shown that, for a precipitation process involving more than one chemical or structural component species with their concentrations deviating from the appropriate thermal equilibrium values, the maximum growth rate description does not generally correspond to that of the maximum degradation rate of the system free energy. The results are then applied to oxygen precipitation in silicon, showing some equilibrium characteristics pertinent to a multicomponent system with intrinsic point defects acting as pseudocomponents. It is also shown that, depending on the intrinsic point defect concentrations at the far field of diffusion, the oxide precipitate can grow either by emitting or by absorbing both vacancies and Si self-interstitials. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 4661-4668 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Strain generated by the bulk precipitation of oxygen in silicon may be relieved by the emission of self-interstitials. The equations describing diffusion-controlled precipitation with a volume constraint relieved by the emission of self-interstitials are given and applied to two model systems which take into account the buildup of a self-interstitial supersaturation. In the first model system, it is shown that precipitates starting to grow within the same volume in which others have been growing for some time will finally shrink and disappear. The shrinkage is driven by the self-interstitial supersaturation. In the second model system the self-interstitials generated by growing precipitates in a given region are found to transport thermodynamic information on the precipitation in this region to adjacent volume regions, where they can influence nucleation and growth of precipitates. The correlation between oxygen fluctuations and precipitation fluctuations are discussed in terms of the effects occurring in the ideal model system. Finally, a similar approach is used to mathematically describe carbon and silicide bulk precipitation.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 1841-1845 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recent experiments have shown that quantum well structures grown on a GaAs substrate can be destroyed by dopant diffusion. It is observed that existing models proposed to explain the phenomena are not in accordance with most available experimental results. We propose an alternative mechanism to explain the quantum well destruction phenomenon. The mechanism is based on the effect of the Fermi level on the concentrations of charged point defects which contribute to diffusion processes. This conceptually simple mechanism is consistent with most available experimental results on a qualitative basis. In this mechanism, the doping level and the doping type (p or n) are of primary importance, and not some other detailed atomistic nature of the dopant species. Furthermore, it is the presence of the dopant that is important, and not its motion, i.e., its diffusion.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 4048-4055 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In spite of various reports that the density of misfit dislocations threading a growing heteroepitaxial thin film can be considerably reduced by means of using a "compliant substrate," the underlying physical mechanisms are not well understood. The common theoretical models suppose that the growing film can preferably relax in an elastic way by slipping on this kind of substrate. This idea, however, requires us to suppose macroscopic slip displacements. Such displacements are disregarded in the common theories and not reported to occur experimentally. This very doubtful free-slipping hypothesis has been used to establish a force balance ("strain partitioning") between the growing film and the template layer below it and, consequently, to theoretically derive an enhanced critical thickness for the onset of slip of misfit dislocations. In the present article, more realistic mechanisms are discussed, including early plastic relaxation at a low film thickness where multiplicative interaction of dislocations hardly occurs. Possibilities for an enhanced elastic relaxation of the film in the case of Stranski–Krastanow island growth are discussed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 7045-7050 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Indiffusion profiles of sulfur in gallium arsenide were determined by secondary ion mass spectroscopy. In order to evaluate the shape of the profiles, a set of coupled reaction–diffusion equations was solved numerically. From the simulated nonequilibrium indiffusion profiles of sulfur, which diffuses into gallium arsenide via the kick-out mechanism, both the diffusion coefficient and the equilibrium concentration of arsenic self-interstitials were simultaneously determined. Transmission electron microscopy revealed that, due to an arsenic supersaturation, extrinsic dislocation loops have formed. The Fermi-level effect is more pronounced at lower diffusion temperatures and provides an additional driving force for the loop formation, agreeing well with the occurrence of larger faulted loops at a diffusion temperature of 950 °C rather than at 1100 °C. The complex behavior of the sulfur indiffusion can be quantitatively described by taking into account extended defects. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 3856-3862 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Large-area wafer bonding of different III–V compound semiconductors in an ultrahigh vacuum background is demonstrated. The bonding procedure, the microstructure, and the mechanical strength of the bonded GaAs/InP and GaAs/GaP interfaces were studied. The cleaning procedure and the bonding were separated in order to avoid undesired artifacts and thermal stress at the interface. First, thermally generated atomic hydrogen was employed to clean the surfaces. Then, the wafers were brought into contact below 150 °C. At contact, the interface formed spontaneously over the whole wafer area without application of a mechanical load. Transmission electron microscopy showed the formation of atomically direct interfaces and misfit dislocation networks. The fracture surface energy was measured as being comparable to that of respective bulk materials. Heat treatments of the bonded GaAs/InP samples led to relaxation of the interfaces but also to the formation of nanoscopic voids in the interface plane and volume dislocations. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 2825-2829 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Excimer laser ablation was used to deposit epitaxial thin films of Ba2Bi4Ti5O18 having mostly c-axis oriented grains. The ferroelectric layer was deposited on an epitaxial conducting oxide electrode layer of LaNiO3, the electrode layer in turn being grown on an epitaxial buffer layer stack on single crystalline (100)-oriented silicon wafers of 3 in. diameter. X-ray diffraction measurements indicate a strong c-axis orientation of the ferroelectric layer. Scanning electron microscopy and atomic force microscopy were used to observe the microstructure of the films and these revealed the homogenous quality of the film with good uniformity over the wafers. Well-defined, saturated ferroelectric hysteresis loops were observed in the compound with values of 1.3 and 0.6 μC/cm2 as saturation and remnant polarization values, respectively, and a coercive field of 47 kV/cm. The results of I–V measurements and complex impedance spectroscopy measurements are presented and a defect formula is proposed for the compound. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 2453-2458 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Physical and numerical modeling of impurity gettering from multicrystalline Si for solar cell production has been carried out using Fe as a model impurity. Calculated change of nonradiative recombination coefficient of minority carriers in the course of gettering is used as a tool for evaluating the gettering efficiency. A derivation of the capture cross section of impurity precipitates, as compared to single atom recombination centers, is presented. Low efficiency of the conventional application of the gettering process is explained by the modeling results. The variable temperature gettering process is modeled and predicted to provide high gettering efficiency and short needed gettering times. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 561-563 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The stability of thin interfacial oxide layers between bonded silicon wafers is investigated experimentally and theoretically. For usual bonding temperatures around 1100 °C and typical times of a few hours, the oxygen diffusivity is not high enough to allow the oxide layer dissolution. For aligned wafers of the same orientation, the oxide layer instead tends to disintegrate in order to minimize the SiO2/Si interface energy. It is possible to stabilize a uniform interfacial oxide layer by rotationally misorienting the two wafers by an angle θ exceeding a critical angle, θ crit, estimated to be between 1° and 5°.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...