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  • 1
    Electronic Resource
    Electronic Resource
    Thin-film modeling for mechanical measurements: Should membranes be used or plates? (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 4244-4248 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The two limits for modeling vibrating thin films, viz as a plate or as a membrane, are discussed. In terms of these limits the sources of experimental uncertanties are identified and the advantages of using films which can be modeled as membranes are explained. The mathematical formalism for treating films as vibrating membranes is developed and relations for self-consistency checks are presented. The drive mechanisms used to generate vibrations in the films are also discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350804
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  • 2
    Electronic Resource
    Electronic Resource
    Vibrating membrane elastometer for reliable measurement of mechanical properties of metallic films (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 494-501 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe an apparatus for measuring the biaxial mechanical properties of metallic films. A circular knife-edge support forms a drum-head geometry over which the film to be studied is stretched. The film's tension is obtained from the frequency of its membrane modes, and its strain by using an optical technique. The biaxial modulus is obtained from the ratio of tension and strain. An electronic detection system is developed that regeneratively locks to the film's resonant frequency. The system is also capable of measuring the film's damping when the lock is switched off.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142093
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  • 3
    Electronic Resource
    Electronic Resource
    Interfacially ordered C60 films on Cu(111) substrates (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 742-747 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: C60(111) films are grown on Cu(111)/mica and Cu(111)/Ag(111)/mica substrates, and their structures are studied by x-ray diffraction. For growth temperatures ranging from 130 to 240 °C, well-ordered C60(111) overlayers form in doubling-positioning (twinned) in-plane structures. These in-plane structures are oriented such that their [22¯0] directions are parallel (in-phase), and rotated 30.0° relative to close-packed directions of their Cu(111) substrates. The rotated structures grow depending on the kinetics of the growth process, as well as the surface structural properties of the copper substrates. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360820
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  • 4
    Electronic Resource
    Electronic Resource
    Biaxial elastic modulus of metallic films determined from vibrating circular membranes (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2614-2616 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The biaxial moduli of free-standing metallic films have been determined from their behavior as elastically tensioned membranes. Errors due to thickness determination and warping of the films are eliminated, thereby opening up the possibility of solving a number of controversial issues. The method combines the determination of stress from the frequency of the membrane modes with optical measurements of strain. Tests on Ta and Ni films yield values of the biaxial modulus in good agreement with calculated literature data.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101953
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  • 5
    Electronic Resource
    Electronic Resource
    Young's modulus of a thin film determined from the peak shifts of its membrane modes (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 2024-2026 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The perturbations of membrane modes of a circular film due to its plate rigidity is studied. A single mathematical expression valid for all orders of resonant modes is derived, and a new method for measuring the Young's modulus is described that is based on finding the frequency shifts of thin-film membrane modes. The Young's moduli of textured aluminum and nickel films are measured and found in good agreement with their calculated literature values [D. Baral, J. B. Ketterson, and J. E. Hilliard, J. Appl. Phys. 57, 1076 (1985)].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.108347
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  • 6
    Electronic Resource
    Electronic Resource
    Growth and microstructure of interfacially oriented large-crystalline-grain C60 sheets (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 1877-1879 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: C60 films reaching sheet thicknesses of ∼10 μm have been grown in vacuum by using a custom-built effusion cell generating a beam of C60 molecules at flux rates several times higher than rates achieved by conventional methods. High quality films are grown epitaxially on Muscovite 2M1 mica substrates with double domain structures. X-ray diffraction measurements show that in the [111] direction, the structural coherency of the films reaches ∼5000 A(ring). Since with increasing thickness the mosaic structures of the films do not disorder significantly, the film grains remain well oriented away from the interface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111785
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  • 7
    Electronic Resource
    Electronic Resource
    Growth and interfacial evolution of oriented C60 overlayers on Au(111) (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3901-3903 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-quality C60(111) overlayers are grown on Au(111)/Ag(111)/mica substrates and their structures studied by x-ray diffraction. The structural evolution of these overlayers is investigated for growth temperatures from 120 to 290 °C. C60(111) overlayers undergo an in-plane orientational reordering at To∼150 °C. Above this temperature, the rotated and commensurate in-plane structures coexist with each other. The rotated structures evolve from the in-plane structures, which predominate at temperatures below To. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.115311
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  • 8
    Electronic Resource
    Electronic Resource
    Elastic properties of polymer films. 1. Elastic constants of a polyimide film determined by Brillouin scattering and mechanical techniques (1993)
    s.l. : American Chemical Society
    Macromolecules 26 (1993), S. 6184-6189 
    Details
    ISSN: 1520-5835
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ma00075a008
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  • 9
    Electronic Resource
    Electronic Resource
    Electrochemical studies on CoCr films as a function of substrate temperature and post-deposition heat treatment (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 3282-3285 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The corrosion resistance of dc magnetron sputtered Co79Cr21 thin films is studied by electrochemical means as a function of substrate temperature Ts ranging from −196 to 375 °C. The corrosion activity increases with Ts and peaks at ∼300 °C. This behavior correlates with the substrate temperature dependence of saturation magnetization of the films. The source of corrosion is suggested to be primarily associated with the segregated Co-rich material. Heat treatment in vacuum at 500 °C significantly improves the corrosion resistance. Evidence is provided suggesting dilution of Co concentration in segregated Co-rich regions is responsible for this improvement.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344121
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  • 10
    Electronic Resource
    Electronic Resource
    Solid-state reactions in high-temperature superconductor-ceramic interfaces; Y-Ba-Cu-O on Al2O3 versus yttria-stabilized ZrO2, and MgO (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 2524-2527 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have prepared, using molecular-beam epitaxial techniques, superconducting Y-Ba-Cu-O films directly on Al2O3, yttria-stabilized ZrO2 (YSZ), and MgO without buffer layers. The structure and stoichiometry of the films on Al2O3 are compared with those prepared on YSZ and MgO and found in large part determined by reactions with the substrates. The films on Al2O3 consist of textured Y2Ba4Cu8O20−x with superconducting onset at 80 K and zero resistance at 69 K, whereas on YSZ and MgO, YBa2Cu3O7−z films are formed. Auger electron depth profile spectroscopy in conjunction with structural and transport studies suggest that copper is depleted from the region near the Al2O3 substrate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345506
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