Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1214-1218
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An apparatus is described for measuring the index of refraction as a function of temperature throughout the visible wavelength region. The apparatus has an accuracy of 1×10−4 in determining the index and has the flexibility to be modified to measure indices at nonvisible wavelengths. The performance and theory of operation are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142002
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