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  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 347-352 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Titanium surfaces that have been prepared for adhesive bonding are difficult to characterize because they exhibit micro-rough and, in some cases, macro-rough morphologies, Errors can arise in the interpretation of sputter depth profiles obtained from such surfaces dur to the analysis geometry, i.e. large sampling probes and shadowing of the ion etching beam. This can be avoided either by scanning Auger microscopy or by x-ray photoelectron spectroscopy to obtain estimates of the surface layer composition and thickness. We illustrate the utility of both techniques by studying the mechanisms of failure in adhesive bonds formed at Ti—6Al—4V surfaces before and after exposure to air at 330°C for 165 hours.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 359-365 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The methodology of failure analysis and the use of XPS sputter-depth profiles in failure analysis is illustrated in three examples: a titanium adhesive bond, a multilayer optical filter, and an ohmic contact. XPS sputter-depth profiles supplement those obtained using AES and are essential to the failure analysis of a non-conducting sample or one that is easily damaged by an electron beam. XPS sputter-depth profiles also allow chemical state determination and improved quantification, especially for samples in which the Auger signals of different elements overlap.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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