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  • 1
    Electronic Resource
    Electronic Resource
    Photothermal displacement detection and transient imaging of bump growth dynamics in laser zone texturing of Ni–P disk substrates (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 5618-5620 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A novel photothermal displacement method has been applied to probe the pulsed laser-induced feature formation of Ni–P hard disk substrates in the laser zone texturing process. The deflection signals of the reflected probing beam show the variation of the feature shape resulting from different pulse energies of the heating laser beam. A laser flash photography system is also developed to visualize the feature growth dynamics. This system has nanosecond time resolution and about one micron spatial resolution. Both techniques show clearly the transient melting and deformation process and the time scale of such deformation. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.369817
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  • 2
    Electronic Resource
    Electronic Resource
    Photothermal displacement measurement of transient melting and surface deformation during pulsed laser heating (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2093-2095 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A photothermal displacement method has been developed to probe the pulsed laser-induced transient melting and surface deformation of Ni–P hard disk substrates. A probing He–Ne laser beam is aligned collinearly with the near-infrared nanosecond pulsed heating beam. The He–Ne beam spot is scanned on the microfeatures formed on the sample surface by the pulsed laser heating. The deflection signals show the variation of the feature shape resulting from different pulse energies of the heating laser beam. The transient deflection signal also reveals that the time scale of the surface motion is in the range of several hundred nanoseconds. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122388
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  • 3
    Electronic Resource
    Electronic Resource
    Noncontact nanosecond-time-resolution temperature measurement in excimer laser heating of Ni–P disk substrates (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 3191-3193 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The thermal emission from a Ni–P disk substrate heated by a pulsed excimer laser is measured with nanosecond time resolution. A fast InGaAs photodetector is employed to capture the thermal emission signal. The spectral surface reflectivity is simultaneously measured in situ. The transient surface temperature is derived from the spectral thermal emission signal on the basis of Planck's blackbody radiation intensity distribution. The experimental results and analytical solutions are compared and an important parameter involving the thermal diffusivity and conductivity in the transient temperature response of the material is evaluated. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120286
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