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  • 1
    Online Resource
    Online Resource
    San Diego :Elsevier Science & Technology,
    Keywords: X-ray spectroscopy. ; Electronic books.
    Type of Medium: Online Resource
    Pages: 1 online resource (481 pages)
    Edition: 1st ed.
    ISBN: 9781483155531
    Language: English
    Note: Front Cover -- Advances in X-Ray Spectroscopy -- Copyright Page -- Table of Contents -- Foreword -- Preface -- Introduction -- CHAPTER 1. Relativistic Theory of X-ray Satellites -- 1.1 INTRODUCTION -- 1.2 THE PHOTON-ELECTRON AND ELECTRON-ELECTRON INTERACTION -- 1.3 THE MULTICONFIGURATION DIRAC-FOCK METHOD -- 1.4 RELATIVISTIC INTERMEDIATE COUPLING: THE n'snp5-C0NFIGURATI0N -- 1.5 RELATIVISTIC ANALYSIS OF THE Kαh-HYPERSATELLITE SPECTRUM -- References -- CHAPTER 2. Electronic Structure of Metals and Alloys by X-ray Spectroscopy -- 2.1 INTRODUCTION -- 2.2 EXPERIMENTAL CONSIDERATIONS -- 2.3 PURE METALS -- 2.4 ALLOYS -- References -- CHAPTER 3. Understanding and Improving Crystals for X-ray Fluorescence -- 3.1 INTRODUCTION -- 3.2 PARAMETERS IN CRYSTAL DIFFRACTION -- 3.3 APPLICATIONS IN X-RAY FLUORESCENCE ANALYSES -- 3.4 APPLICATIONS IN PLASMA DIAGNOSTICS -- 3.5 SELECTING A CRYSTAL AND PREDICTING ITS UTILITY -- References -- CHAPTER 4. Nuclear Finite Size Effects in X-ray Spectra -- 4.1 INTRODUCTION -- 4.2 ISOTOPE SHIFT OF K X-RAYS -- 4.3 MAGNETIC HYPERFINE EFFECTS -- References -- CHAPTER 5. Bent Crystal Spectroscopy for X- and y-radiations -- 5.1 INTRODUCTION -- 5.2 JOHANN'S SPECTROMETER -- 5.3 JOHANSSON'S METHOD -- 5.4 CAUCHOIS' METHOD -- 5.5 DuMOND'S METHOD -- 5.6 THE CYLINDRICAL BENDING OF CRYSTALS -- 5.7 THE SPHERICAL BENDING OF CRYSTALS -- 5.8 PECULIARITIES IN THE USE OF BENT CRYSTALS IN DIFFERENT SPECTRAL REGIONS -- References -- CHAPTER 6. Resonant X-ray Emission Spectroscopy in Solids -- 6.1 INTRODUCTION -- 6.2 PHOTO-ABSORPTION TOWARDS LOCALISED STATES -- 6.3 EMISSIONS FROM LOCALISED STATES: RESONANCE LINES -- 6.4 RESONANT X-RAY EMISSION SPECTROSCOPY AS A MEANS OF STUDYING EXCITED STATES IN SOLIDS -- 6.5 CONCLUSION -- References -- CHAPTER 7. From X-ray to UV Physics with Synchrotron Radiation -- 7.1. INTRODUCTION. , 7.2 SINGLE EXCITATIONS AND QUASI-PARTICLES -- 7.3 SYNCHROTRON RADIATION AS A PROBE FOR INTERMEDIATE ELECTRONS -- 7.4 QUASI-PARTICLE DECAY MODES AND CORRELATION SATELLITES -- 7.5 MANY-BODY EFFECTS AND THE DAMPING OF QUASI-PARTICLE RESONANCES -- 7.6 ENERGY COINCIDENCES BETWEEN SINGLE AND DOUBLE IONISATION THRESHOLDS -- 7.7 RELATIVISTIC EFFECTS IN THE CALCULATION OF CORRELATION SATELLITES -- 7.8 MANY-BODY EFFECTS IN PHOTO-ABSORPTION -- 7.9 THE DOUBLE IONISATION ANOMALY IN THE 5p-SPECTRUM OF Ba -- 7.10 CONCLUSIONS -- References -- CHAPTER 8. Comparison of Relativistic Atomic SCF Calculations with Improved Experimental Data -- 8.1 INTRODUCTION -- 8.2 AVAILABLE EXPERIMENTAL DATA -- 8.3 RESULTS AND DISCUSSION -- Acknowledgments -- References -- CHAPTER 9. Reflection of X-rays by Bent Crystals -- 9.1 INTRODUCTION -- 9.2 APPLICATIONS OF BENT-CRYSTAL X-RAY DIFFRACTION -- 9.3 THE PREPARATION AND BENDING OF CRYSTALS -- 9.4 DIFFRACTION PATTERNS OF BENT CRYSTALS -- 9.5 CONCLUSION -- References -- CHAPTER 10. The Two-crystal Spectrometer for X-ray Spectroscopy -- 10.1 INTRODUCTION -- 10.2 SINGLE-CRYSTAL DIFFRACTION PATTERN (SCDP) AND THE GRAPHIC METHOD -- 10.3 THE ALIGNMENT OF THE CRYSTALS -- 10.4 THE TWO-CRYSTAL SPECTROMETER (DCS) -- 10.5 MULTI-CRYSTAL ARRANGEMENTS -- 10.6 PRACTICAL ARRANGEMENTS AND EXPERIMENTAL PROCEDURES -- References -- CHAPTER 11. The So-called Correction of Bragg's Law -- 11.1 A SOLITARY RAY: THE REFRACTIVE INDEX -- 11.2 THE CASE OF MORE THAN ONE DIFFRACTED RAY INSIDE THE CRYSTAL -- 11.3 TWO BEAMS: GEOMETRICAL THEORY CORRECTED FOR REFRACTION IN BRAGG REFLECTION -- 11.4 TWO BEAMS IN TRANSMISSION: THE SYMMETRICAL LAUE CASE -- 11.5 TWO BEAMS: DYNAMICAL THEORY -- 11.6 THE INFLUENCE OF SIMULTANEOUS REFLECTIONS -- 11.7 CONCLUSIONS -- Acknowledgments -- References -- CHAPTER 12. On the Anisotropie Emission of Characteristic X-rays. , 12.1 INTRODUCTION -- 12.2 INVESTIGATION OF THE CHLORINE Kβ-SPECTRUM IN p-DICHLOROBENZENE -- 12.3 ANISOTROPIC EMISSION OF THE K-RADIATION OF BORON AND NITROGEN IN HEXAGONAL BORON NITRIDE -- References -- CHAPTER 13. Molecular Orbitals and X-ray Spectra -- 13.1 INTRODUCTION -- 13.2 X-RAY ABSORPTION SPECTRA -- 13.3 X-RAY EMISSION SPECTRA -- References -- CHAPTER 14. X-ray Spectra of Molecular Gases -- 14.1 INTRODUCTION -- 14.2 ABSORPTION -- 14.3 EMISSION -- References -- CHAPTER 15. Many-body Effects in X-ray Band Spectra of Metals -- 15.1 INTRODUCTION -- 15.2 THE LOW-ENERGY TAIL (A) -- 15.3 THE PLASMON SATELLITE (B) -- 15.4 THE PLASMARON STRUCTURE (C) -- 15.5 THE MND EDGE ANOMALY (D) (EMISSION AND ABSORPTION) -- 15.6 THE PLASMON SATELLITE EDGE (E) -- 15.7 THE PLASMON RESONANT STRUCTURE (F) -- References -- CHAPTER 16. The History and Modern Practice of EXAFS Spectroscopy -- 16.1 INTRODUCTION -- 16.2 WHAT IS EXAFS? -- 16.3 HISTORY -- 16.4 SIMPLIFIED PHYSICS -- 16.5 SOME EXAMPLES -- 16.6 WHY, AFTER 50 YEARS? -- References -- CHAPTER 17. Chemical Shifts in X-ray Absorption Spectra -- 17.1 INTRODUCTION -- 17.2 PARAMETERS AFFECTING THE CHEMICAL SHIFT -- 17.3 EFFECTIVE CHARGE AND THE CHEMICAL SHIFT -- 17.4 PHYSICAL BASIS OF CHEMICAL SHIFTS -- 17.5 CONCLUSIONS -- References -- CHAPTER 18. Chemical Shifts and Changes in Shape of X-ray Emission Lines in Solids -- 18.1 INTRODUCTION -- 18.2 THEORETICAL ASPECTS -- 18.3 EXPERIMENTAL STUDIES AND THEIR APPLICATIONS -- Acknowledgments -- References -- CHAPTER 19. X-ray Optics -- 19.1 INTRODUCTION -- 19.2 REFLECTION OF X-RAYS -- 19.3 THE DIFFRACTION OF X-RAYS BY GRATINGS -- 19.4 OPTICAL SYSTEMS -- 19.5 OTHER DEVICES -- References -- CHAPTER 20. Potential Characteristics and Applications of X-ray Lasers -- 20.1 INTRODUCTION -- 20.2 COHERENT VACUUM-UV GENERATION -- 20.3 RECENT X-RAY LASER RESEARCH. , 20.4 ANTICIPATED X-RAY LASER CHARACTERISTICS -- 20.5 X-RAY HEATING OF MATTER -- 20.6 SPECULATION ON X-RAY LASER APPLICATIONS -- 20.7 DISCUSSION -- Acknowledgments -- References -- CHAPTER 21. Electron Brëmsstrahlung -- 21.1 INTRODUCTION -- 21.2 BEST AVAILABLE TECHNOLOGY FOR CALCULATING BRËMSSTRAHLUNG CROSS-SECTIONS -- 21.3 THE END-POINTS OF THE BRËMSSTRAHLUNG SPECTRUM -- 21.4 THE COULOMB SPECTRUM -- 21.5 SCREENING EFFECTS -- 21.6 ANGULAR DISTRIBUTIONS OF BRËMSSTRAHLUNG RADIATION -- References -- CHAPTER 22. Band Structure of Semiconductors by X-ray Spectroscopy -- 22.1 INTRODUCTION -- 22.2 ELEMENTS -- 22.3 COMPOUNDS -- Acknowledgments -- References -- CHAPTER 23. X-ray Raman Band and Plasmon Line in the Compton Spectrum -- 23.1 INTRODUCTION -- 23.2 GENERAL THEORY OF X-RAY INELASTIC SCATTERING -- 23.3 EXPERIMENTAL -- 23.4 DISCUSSION -- Acknowledgments -- References -- CHAPTER 24. Isochromat Spectroscopy -- 24.1 INTRODUCTION -- 24.2 PRINCIPLES -- 24.3 THE EXPERIMENTAL ARRANGEMENT -- 24.4 APPLICATIONS AND RESULTS OF IS -- 24.5 CONCLUSIONS -- References.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 6413-6417 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Study of an α-Al2O3 single crystal by electron-induced x-ray emission spectroscopy and cathodoluminescence is reported. The relative intensities of optical emissions due to F+ and F centers have been determined as a function of the parameters of the electron beam and the annealing of the sample. It is shown that the F+ centers, i.e., the oxygen vacancies with one trapped electron, are predominant when the density of the incident electron beam increases. Similar variation is observed when the electron energy varies from 1 to 4 keV. From the comparison between x-ray and optical spectra, the F+ centers are determined to be stable defects in the bulk of the sample. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 2909-2912 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Radiative recombination from states located in the band gap of single-crystal α-alumina has been observed by electron-induced x-ray emission spectrometry. The variation of intensity as a function of the incident electron beam current has been determined. From this variation, we show that trapping of thermalized incident electrons takes place in the defect sites associated with the observed states. From the binding energies of the states, the sites have been identified as oxygen vacancies. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 6044-6045 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ag3Ni3 and Ag4Ni4 multilayers have been analyzed by electron induced x-ray emission spectroscopy. Changes observed on the density of valence states in the Ni layers, with respect to the bulk, are correlated with the variation of the lattice parameter deduced from x-ray diffraction experiments. In the Ag layers no change in the density of valence states is observed and the lattice parameter is almost unchanged. These behaviors are explained by an electronic effect due to the low dimensionality of the multilayers. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 374-378 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A laboratory x-ray spectrometer designed for routine analysis in the 15–60-keV spectral range is described. It consists of a 40-cm bent-crystal transmission spectrometer in the Cauchois geometry, controlled by a microcomputer. The choice of the crystal analyzer and of the detection system is discussed. The instrument is well suited for large spectral range x-ray absorption and emission spectroscopy (XAS, XES) and x-ray source diagnostics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3466-3471 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe an instrument designed for studying the electronic structure of bulk, surface, and deep solid–solid interface. The analysis is made by soft-x-ray emission spectroscopy induced by electron bombardment. The target is placed under ultrahigh vacuum and can be prepared and treated in situ. High resolution is achieved both as concerns the photon energy and the electron-beam energy. Tests have been made in the dispersive mode and in the characteristic isochromat mode. In both cases experimental resolution is in good agreement with the expected one.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 21 (1966), S. 1001-1001 
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 4 (1971), S. 383-387 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Some samples of S, Se, Te and S–Se and S–Te mixtures have been irradiated by fast electrons (up to 50 keV). Allotropic modifications of S and Se have been observed; these are due to the polymerization of opened S8 and Se8 rings under the effect of polarization of the electron beam.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Physics and Chemistry of Solids 36 (1975), S. 575-577 
    ISSN: 0022-3697
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Surface Science 162 (1985), S. 871-874 
    ISSN: 0039-6028
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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