In:
Infrared and Laser Engineering, Shanghai Institute of Optics and Fine Mechanics, Vol. 51, No. 4 ( 2022), p. 20210942-
Type of Medium:
Online Resource
ISSN:
1007-2276
Uniform Title:
Application of terahertz mapping in high throughput measurement of the electrical conductance of Cu alloy thin films (Invited)
DOI:
10.3788/IRLA/2022/51/4
DOI:
10.3788/IRLA20210942
Language:
English
,
Chinese
Publisher:
Shanghai Institute of Optics and Fine Mechanics
Publication Date:
2022
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