In:
Chinese Journal of Luminescence, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Vol. 35, No. 12 ( 2014), p. 1459-1463
Type of Medium:
Online Resource
ISSN:
1000-7032
Uniform Title:
PTCDA/P-Si光电探测器欧姆接触层的XPS测试分析
DOI:
10.3788/fgxb/2014/35/12
DOI:
10.3788/fgxb20143512.1459
Language:
English
,
Chinese
Publisher:
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Publication Date:
2014
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