In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 33, No. 9S ( 1994-09-01), p. 5540-
Abstract:
Pulse responses for high-speed nondestructive readout in ferroelectrics have been studied using a ferroelectric lead zirconate titanate thin film as a memory capacitor. A critical pulse width t * , defined as the maximum of the pulse width for which the system returns to the initial polarization state after the removal of the applied pulse field, is found to exist, suggesting the possibility of a nondestructive readout in ferroelectric memory. The observed pulse responses are compared with those of circuit simulation.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.33.5540
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1994
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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