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  • 1
    In: Kidney International, Elsevier BV, Vol. 53, No. 4 ( 1998-04), p. 1061-1067
    Type of Medium: Online Resource
    ISSN: 0085-2538
    Language: English
    Publisher: Elsevier BV
    Publication Date: 1998
    detail.hit.zdb_id: 2007940-0
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  • 2
    In: Psychopathology, S. Karger AG, Vol. 51, No. 2 ( 2018), p. 110-121
    Abstract: 〈 b 〉 〈 i 〉 Background: 〈 /i 〉 〈 /b 〉 Little is known about narcissistic traits in borderline personality disorder (BPD). This exploratory study aimed to illustrate the associations between total, grandiose, and vulnerable narcissism and gender, diagnostic features of BPD and narcissistic personality disorder (NPD), and psychopathology in BPD patients. 〈 b 〉 〈 i 〉 Sampling and Methods: 〈 /i 〉 〈 /b 〉 The Pathological Narcissism Inventory and psychometric measures for impulsivity, anger, borderline symptom severity, personality organization, depression, and rejection sensitivity were completed by 65 BPD patients. Statistical analyses were conducted using the 〈 i 〉 t 〈 /i 〉 test, Pearson correlation, and multivariate regression analyses. 〈 b 〉 〈 i 〉 Results: 〈 /i 〉 〈 /b 〉 Male BPD patients displayed higher narcissistic scores than females ( 〈 i 〉 p 〈 /i 〉 & #x3c; 0.01). Grandiose narcissism showed a stronger association with NPD than with BPD ( 〈 i 〉 p 〈 /i 〉 & #x3c; 0.01) while vulnerable narcissism was only associated with BPD ( 〈 i 〉 p 〈 /i 〉 & #x3c; 0.01). Rejection sensitivity ( 〈 i 〉 p 〈 /i 〉 & #x3c; 0.01) and depression ( 〈 i 〉 p 〈 /i 〉 & #x3c; 0.001) predicted vulnerable narcissism. 〈 b 〉 〈 i 〉 Conclusion: 〈 /i 〉 〈 /b 〉 Vulnerable narcissism is closely associated with BPD and appears to be more dysfunctional than grandiose narcissism. A comprehensive consideration of both traits is recommended. Our results might help to generate hypotheses for further research on pathological narcissism in the spectrum of personality disorders. Future studies are advised to apply complementary measures and take new diagnostic approaches of DSM-5 and ICD-11 into account.
    Type of Medium: Online Resource
    ISSN: 0254-4962 , 1423-033X
    RVK:
    Language: English
    Publisher: S. Karger AG
    Publication Date: 2018
    detail.hit.zdb_id: 1483565-4
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  • 3
    Online Resource
    Online Resource
    Walter de Gruyter GmbH ; 2002
    In:  Zeitschrift für wirtschaftlichen Fabrikbetrieb Vol. 97, No. 12 ( 2002-12-18), p. 606-609
    In: Zeitschrift für wirtschaftlichen Fabrikbetrieb, Walter de Gruyter GmbH, Vol. 97, No. 12 ( 2002-12-18), p. 606-609
    Abstract: Die Bereitstellung von Produktinformationen in großen Unternehmen sowie der an Wichtigkeit zunehmende Austausch von Informationen zwischen Kooperationspartnern macht neue Technologien zur Datenbereitstellung und -verteilung erforderlich. Das Internet bietet dabei die Möglichkeit, auf Informationen standortübergreifend und zeitunabhängig zuzugreifen. Vor diesem Hintergrund wurde ein Internetbasiertes Anforderungsverarbeitungswerkzeug als Modul einer verteilten integrierten Arbeitsumgebung zur Unterstützung einer standortübergreifenden Kooperation am Institut für Konstruktionslehre der TU Braunschweig entwickelt. Das Werkzeug wird u. a. im Rahmen des SFB 562 „Robotersysteme für Handhabung und Montage – hochdynamische Parallelstrukturen mit adaptronischen Komponenten –“ für die systematische Entwicklung eingesetzt.
    Type of Medium: Online Resource
    ISSN: 2511-0896 , 0947-0085
    RVK:
    RVK:
    Language: English
    Publisher: Walter de Gruyter GmbH
    Publication Date: 2002
    detail.hit.zdb_id: 2133068-2
    detail.hit.zdb_id: 1225290-6
    SSG: 3,2
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  • 4
    In: Engineering Reports, Wiley, Vol. 4, No. 12 ( 2022-12)
    Abstract: Through silicon vias (TSVs) are a key enabling technology for interconnection and realization of complex three‐dimensional integrated circuit (3D‐IC) components. In order to perform failure analysis without the need of destructive sample preparation, x‐ray microscopy (XRM) is a rising method of analyzing the internal structure of samples. However, there is still a lack of evaluated scan recipes or best practices regarding XRM parameter settings for the study of TSVs in the current state of literature. There is also an increased interest in automated machine learning and deep learning approaches for qualitative and quantitative inspection processes in recent years. Especially deep learning based object detection is a well‐known methodology for fast detection and classification capable of working with large volumetric XRM datasets. Therefore, a combined XRM and deep learning object detection workflow for automatic micrometer accurate defect location on liner‐TSVs was developed throughout this work. Two measurement setups including detailed information about the used parameters for either full IC device scan or detailed TSV scan were introduced. Both are able to depict delamination defects and finer structures in TSVs with either a low or high resolution. The combination of a 0.4 objective with a beam voltage of 40 kV proved to be a good combination for achieving optimal imaging contrast for the full‐device scan. However, detailed TSV scans have demonstrated that the use of a 20 objective along with a beam voltage of 140 kV significantly improves image quality. A database with 30,000 objects was created for automated data analysis, so that a well‐established object recognition method for automated defect analysis could be integrated into the process analysis. This RetinaNet‐based object detection method achieves a very strong average precision of 0.94. It supports the detection of erroneous TSVs in both top view and side view, so that defects can be detected at different depths. Consequently, the proposed workflow can be used for failure analysis, quality control or process optimization in R & D environments.
    Type of Medium: Online Resource
    ISSN: 2577-8196 , 2577-8196
    URL: Issue
    Language: English
    Publisher: Wiley
    Publication Date: 2022
    detail.hit.zdb_id: 2947569-7
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