In:
Surface and Interface Analysis, Wiley, Vol. 40, No. 3-4 ( 2008-03), p. 547-551
Abstract:
The amorphous nanocrystalline semiconductor nanocomposites obtained by evaporation in ultrahigh vacuum at different substrate temperatures show anomalous electro‐physical properties. It may be connected with the structure of clusters which may consist of both crystalline and amorphous phases. The volume portion of the amorphous phase to the nanosized particles can be obtained by the extended x‐ray absorption fine structure (EXAFS) method. In this work we investigate the structure changes of thin nanocomposite films of Ge obtained at condensation temperatures in the range of 25–250 °C by Atomic force microscopy (AFM) and EXAFS methods. Using the method described by Valeev et al . it was shown that the sizes of nanocrystallites in an amorphous matrix vary essentially according to obtaining conditions (according to AFM data); their content vary from 10 to 90%. Copyright © 2008 John Wiley & Sons, Ltd.
Type of Medium:
Online Resource
ISSN:
0142-2421
,
1096-9918
Language:
English
Publisher:
Wiley
Publication Date:
2008
detail.hit.zdb_id:
2023881-2
Permalink