In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 27, No. 1R ( 1988-01-01), p. 127-
Abstract:
X-ray computed tomography using synchrotron radiation (SR) as X-ray source potentially provides CT images of improved quality, since SR produces tunable, monochromatized and collimated X-ray beams of high flux density. We can obtain CT images of small samples rapidly with better spatial resolution and contrast; we can also obtain the spatial distribution of a specific element using the absorption edge. In this paper, a method for improving the spatial resolution of such a system is presented, involving the magnification of projection images using asymmetric diffraction. First, the modulation transfer function (MTF) of projection images of an X-ray test chart is measured in order to evaluate the spatial resolution. Next, using this method, we show CT images of several industrial materials with spatial resolution of 15∼30 µm and demonstrate the usefulness of SR-CT with a high spatial resolution.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1988
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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