In:
Luminescence, Wiley, Vol. 33, No. 1 ( 2018-02), p. 34-39
Abstract:
To obtain precise life information for vacuum fluorescent displays (VFDs), luminance degradation data for VFDs were collected from a group of normal life tests. Instead of exponential function, the three‐parameter Weibull right approximation method (TPWRAM) was applied to describe the luminance degradation path of optoelectronic products, and two improved models were established. One of these models calculated the average life by fitting average luminance degradation data, and the other model obtained VFD life by combining the approximation method with luminance degradation test data from each individual sample. The results indicated that the test design under normal working stress was appropriate, and the selection of censored test data was simple. The two models improved by TPWRAM both revealed the luminance decaying law for VFD, and the pseudo failure time was accurately extrapolated. It was further confirmed by comparing relative error that using the second model gave a more accurate prediction of VFD life. The improved models in this study can provide technical references for researchers and manufacturers in aspects of life prediction methodology for its development.
Type of Medium:
Online Resource
ISSN:
1522-7235
,
1522-7243
Language:
English
Publisher:
Wiley
Publication Date:
2018
detail.hit.zdb_id:
2001819-8
SSG:
12
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