In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 24, No. 10R ( 1985-10-01), p. 1312-
Abstract:
Josephson junctions with short semiconductor links have been fabricated by a thermal oxidation process. The length and width of typical links are 20 nm and 2 µm, respectively. The two electrodes of the junction are separated by a thin oxide layer and are electrically coupled through an underlying degenerate semiconductor layer. With this structure, it should be possible in principle to fabricate links of length in the 10 nm range with relatively high reproducibility. The I - V characteristics were measured at 4.2 K, from which the I c R n products of 0.1–1.0 mV were obtained. From the rf excitation measurements, more than 33 microwave induced steps were observed at a frequency of 9.18 GHz.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.24.1312
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1985
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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