In:
Applied Physics Letters, AIP Publishing, Vol. 73, No. 22 ( 1998-11-30), p. 3217-3219
Abstract:
Polarized Raman scattering by phonons is used to characterize thin films prepared by laser ablation of La1−xCaxMnO3 targets. It was found that, in the temperature range from 6 to 300 K, phonon spectra of La0.7Ca0.3MnO3 films exhibit observable differences from those in bulk materials (microcrystalline ceramics and single crystals). A significant difference was found in the spectra of “as-grown” films compared to those annealed in oxygen at 800 °C. The observed Raman peaks and their linewidths exhibit an irregular temperature dependence near Tc. A correlation of Raman data with magnetization of the sample was also found.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1998
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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