In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 31, No. 3A ( 1992-03-01), p. L291-
Abstract:
The ion current characteristic of an Ar field ionization source as a function of pressure has been studied using a W tip. The characteristic at low pressures shows a linear relationship, while at high pressures it shows an anisotropic change. A Field Ionization Microscopy image in the latter case shows an extremely localized emission on {110} planes, which suggests the origin of the unusual characteristic at high pressures.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.31.L291
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1992
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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