In:
Applied Physics Letters, AIP Publishing, Vol. 70, No. 26 ( 1997-06-30), p. 3585-3587
Abstract:
The CdS/CdTe interface was investigated by the free-electron laser (FEL) internal photoemission technique. This technique is based on photocurrent spectroscopy utilizing the tunability and intense peak power of the FEL operative in the infrared range. We found two thresholds in the photocurrent spectrum, which can be identified as steplike band discontinuities. It is demonstrated that there is a mixed crystal layer of CdS1−xTex at the CdS/CdTe interface.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1997
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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