In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 49, No. 4R ( 2010-04-01), p. 041801-
Abstract:
Radiation detectors are currently fabricated by a screen-print method at room temperature. However, this method has many disadvantages in terms of thickness control and electron trapping. We fabricated polycrystalline PbI 2 films by a new sedimentation method and compared the results with those obtained by the existing screen-print (SP) method. We investigated the electrical and structural properties of the films. We fabricated 2 ×2 cm 2 sample films with a thickness of about 200 µm. A field emission scanning electron microscopy (FE-SEM) analysis showed that these films were of higher density than those fabricated by a conventional SP method. We also measured the photosensitivity and dark current of the films. The photosensitivity of the films fabricated by the new sedimentation method was 4.8 pC/(mR·mm 2 ), and the dark current was 2.2 pA/mm 2 at 1.0 V/µm. The linearity of the film ranged from 3 to 12 mAs, which is promising for diagnostic radiography.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.49.041801
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2010
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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