In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 36, No. 5B ( 1997-05-01), p. L607-
Abstract:
Ferromagnetic MnSb thin films were grown on CdTe (110) substrates for the first time by hot-wall epitaxy (HWE) technique using polycrystalline powders of MnSb as an evaporation source. The crystal orientation of these thin films was determined by X-ray diffractometry (XRD). The chemical composition of the films was determined by means of electron-probe microanalysis (EPMA) and by electron spectroscopy for chemical analysis (ESCA) depth profiling. Polar magnetooptical Kerr rotation spectra were measured in the 1.2 eV to 4 eV photon energy range.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.36.L607
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1997
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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