In:
Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 35, No. B ( 1991), p. 987-993
Abstract:
An x-ray spectrometer has been designed for pixel by pixel analysis along lines or across selected areas of paintings and other art-objects. Characteristic technical data are: 0.8mm 2 pixel size, 800mm (vert.) by 1000mm (horiz.) by 200mm (perpendicularly to object) motion distances, ±20μm precision in positioning the system, 2x3m maximum object size (mounted vertically); 2.8kW x-ray tube; Si(Li)detector. PC's are used for instrument control and new, complex data evaluation software.
Type of Medium:
Online Resource
ISSN:
0376-0308
,
2631-3626
DOI:
10.1154/S0376030800013215
Language:
English
Publisher:
Cambridge University Press (CUP)
Publication Date:
1991
detail.hit.zdb_id:
2498440-1
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