In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 33, No. 9S ( 1994-09-01), p. 5573-
Abstract:
Charge storage on thin SrTiO 3 (STO) film was investigated by contact electrification. An atomic force microscope (AFM) biased by the voltage was used to deposit the charges by contact electrification and to detect electrostatic force change induced by contact electrified charges. As a result, writing, reading and erasing were demonstrated successfully with a small pattern, small letters and small dot arrays. Besides, two adjacent positive charge dots were discriminated with separation as small as ∼63 nm. These results revealed the potential capability of the present system, i.e., contact electrification on STO film with a biased AFM, for high-density charge storage.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.33.5573
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1994
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
2006801-3
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