In:
Journal of Applied Physics, AIP Publishing, Vol. 115, No. 17 ( 2014-05-07)
Abstract:
The correlation between microstructures and magnetic properties of Pr-Fe-B thin films with thickness in the range of 25–150 nm sputtered on Ta underlayer buffered glass substrates was investigated. The films with thickness of 50–125 nm showed Pr2Fe14B phase with (004) preferred orientation. Perpendicular magnetic properties, including perpendicular magnetic anisotropy, coercivity ((Hc⊥)2T), remanence ratio ((Mr/M2T)⊥), and energy product [(BH)max⊥]2T were improved with increment of magnetic layer thickness to 150 nm. Higher (Hc⊥)2T of 10.3 kOe and energy product [(BH)max⊥] 2T of 19.8 MGOe were attained in the film with the thicker thickness, in turn resulted from fine microstructure and impeded domain wall motion due to nonmagnetic Pr-rich grain boundary phase as a pinning site.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
2014
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
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