In:
Journal of Physics: Conference Series, IOP Publishing, Vol. 2720, No. 1 ( 2024-03-01), p. 012055-
Abstract:
The present study successfully prepared Cu x FeTe 2 (x=0.01, 0.05, 0.1, 0.15, and 0.2) compounds using a high-temperature solid state reaction sintering technique under preparation conditions ranging from 623 K to 823 K. The phase structure and microstructure of Cu x FeTe 2 were determined using X-ray diffraction and scanning electron microscopy. Simultaneously, we studied the Seebeck coefficient and electrical resistivity of the sample. It was found that the samples prepared at 673 K had a purer phase, and the thermal power coefficient was better for samples with a Cu doping concentration below 0.1.
Type of Medium:
Online Resource
ISSN:
1742-6588
,
1742-6596
DOI:
10.1088/1742-6596/2720/1/012055
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2024
detail.hit.zdb_id:
2166409-2
detail.hit.zdb_id:
2209069-1
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