In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 51, No. 9S1 ( 2012-09-01), p. 09LB02-
Abstract:
BiFeO 3 (BFO) thin films have been grown on vicinal SrTiO 3 (STO) (001) substrates by dual-ion-beam sputtering. The Bi/Fe composition ratio was optimized by adjusting the beam current ratio of a dual-ion beam. The domain structure was controlled using a vicinal STO substrate along 〈 100 〉 and 〈 110 〉 . From the results of X-ray diffraction analysis and piezoelectric force microscopy, it is found that BFO thin films grown on vicinal STO along 〈 100 〉 and 〈 110 〉 show stripe and single-domain structures, respectively. It is found that the reduction in the length of non-180° domain walls improves leakage current characteristics, resulting in an enhancement of ferroelectric D – E characteristics. The single-domain BFO thin film shows excellent D – E hysteresis loops at room temperature, with a double remanent polarization (2 P r ) and a double coercive field (2 E c ) of 140 µC/cm 2 and 340 kV/cm, respectively.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.51.09LB02
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2012
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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