In:
IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 18, No. 4 ( 2018-12), p. 592-598
Type of Medium:
Online Resource
ISSN:
1530-4388
,
1558-2574
DOI:
10.1109/TDMR.2018.2875064
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2018
detail.hit.zdb_id:
2061445-7
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