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  • 1
    Online-Ressource
    Online-Ressource
    Oxford University Press (OUP) ; 2012
    In:  European Heart Journal Vol. 33, No. suppl 1 ( 2012-08-02), p. 339-653
    In: European Heart Journal, Oxford University Press (OUP), Vol. 33, No. suppl 1 ( 2012-08-02), p. 339-653
    Materialart: Online-Ressource
    ISSN: 0195-668X , 1522-9645
    Sprache: Englisch
    Verlag: Oxford University Press (OUP)
    Publikationsdatum: 2012
    ZDB Id: 2001908-7
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  • 2
    Online-Ressource
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    Institute of Electrical and Electronics Engineers (IEEE) ; 2020
    In:  IEEE Transactions on Electron Devices Vol. 67, No. 11 ( 2020-11), p. 5082-5090
    In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 67, No. 11 ( 2020-11), p. 5082-5090
    Materialart: Online-Ressource
    ISSN: 0018-9383 , 1557-9646
    Sprache: Unbekannt
    Verlag: Institute of Electrical and Electronics Engineers (IEEE)
    Publikationsdatum: 2020
    ZDB Id: 2028088-9
    ZDB Id: 241634-7
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  • 3
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    Institute of Electrical and Electronics Engineers (IEEE) ; 2021
    In:  IEEE Journal of the Electron Devices Society Vol. 9 ( 2021), p. 450-455
    In: IEEE Journal of the Electron Devices Society, Institute of Electrical and Electronics Engineers (IEEE), Vol. 9 ( 2021), p. 450-455
    Materialart: Online-Ressource
    ISSN: 2168-6734
    Sprache: Unbekannt
    Verlag: Institute of Electrical and Electronics Engineers (IEEE)
    Publikationsdatum: 2021
    ZDB Id: 2696552-5
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  • 4
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    Institute of Electrical and Electronics Engineers (IEEE) ; 2021
    In:  IEEE Transactions on Electron Devices Vol. 68, No. 8 ( 2021-8), p. 3843-3850
    In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 68, No. 8 ( 2021-8), p. 3843-3850
    Materialart: Online-Ressource
    ISSN: 0018-9383 , 1557-9646
    Sprache: Unbekannt
    Verlag: Institute of Electrical and Electronics Engineers (IEEE)
    Publikationsdatum: 2021
    ZDB Id: 2028088-9
    ZDB Id: 241634-7
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  • 5
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    Institute of Electrical and Electronics Engineers (IEEE) ; 2020
    In:  IEEE Journal of the Electron Devices Society Vol. 8 ( 2020), p. 396-406
    In: IEEE Journal of the Electron Devices Society, Institute of Electrical and Electronics Engineers (IEEE), Vol. 8 ( 2020), p. 396-406
    Materialart: Online-Ressource
    ISSN: 2168-6734
    Sprache: Unbekannt
    Verlag: Institute of Electrical and Electronics Engineers (IEEE)
    Publikationsdatum: 2020
    ZDB Id: 2696552-5
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  • 6
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    Institute of Electrical and Electronics Engineers (IEEE) ; 2023
    In:  IEEE Journal of the Electron Devices Society
    In: IEEE Journal of the Electron Devices Society, Institute of Electrical and Electronics Engineers (IEEE)
    Materialart: Online-Ressource
    ISSN: 2168-6734
    Sprache: Unbekannt
    Verlag: Institute of Electrical and Electronics Engineers (IEEE)
    Publikationsdatum: 2023
    ZDB Id: 2696552-5
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  • 7
    In: Journal of Applied Physics, AIP Publishing, Vol. 130, No. 12 ( 2021-09-28)
    Kurzfassung: The development of organic thin-film transistors (TFTs) for high-frequency applications requires a detailed understanding of the intrinsic and extrinsic factors that influence their dynamic performance. This includes a wide range of properties, such as the device architecture, the contact resistance, parasitic capacitances, and intentional or unintentional asymmetries of the gate-to-contact overlaps. Here, we present a comprehensive analysis of the dynamic characteristics of the highest-performing flexible organic TFTs reported to date. For this purpose, we have developed the first compact model that provides a complete and accurate closed-form description of the frequency-dependent small-signal gain of organic field-effect transistors. The model properly accounts for all relevant secondary effects, such as the contact resistance, fringe capacitances, the subthreshold regime, charge traps, and non-quasistatic effects. We have analyzed the frequency behavior of low-voltage organic transistors fabricated in both coplanar and staggered device architectures on flexible plastic substrates. We show through S-parameter measurements that coplanar transistors yield more ideal small-signal characteristics with only a weak dependence on the overlap asymmetry. In contrast, the high-frequency behavior of staggered transistors suffers from a more pronounced dependence on the asymmetry. Using our advanced compact model, we elucidate the factors influencing the frequency-dependent small-signal gain and find that even though coplanar transistors have larger capacitances than staggered transistors, they benefit from substantially larger transconductances, which is the main reason for their superior dynamic performance.
    Materialart: Online-Ressource
    ISSN: 0021-8979 , 1089-7550
    Sprache: Englisch
    Verlag: AIP Publishing
    Publikationsdatum: 2021
    ZDB Id: 220641-9
    ZDB Id: 3112-4
    ZDB Id: 1476463-5
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  • 8
    Online-Ressource
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    Institute of Electrical and Electronics Engineers (IEEE) ; 2020
    In:  IEEE Transactions on Electron Devices Vol. 67, No. 11 ( 2020-11), p. 4672-4676
    In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 67, No. 11 ( 2020-11), p. 4672-4676
    Materialart: Online-Ressource
    ISSN: 0018-9383 , 1557-9646
    Sprache: Unbekannt
    Verlag: Institute of Electrical and Electronics Engineers (IEEE)
    Publikationsdatum: 2020
    ZDB Id: 2028088-9
    ZDB Id: 241634-7
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  • 9
    Online-Ressource
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    The Electrochemical Society ; 2019
    In:  ECS Meeting Abstracts Vol. MA2019-01, No. 25 ( 2019-05-01), p. 1238-1238
    In: ECS Meeting Abstracts, The Electrochemical Society, Vol. MA2019-01, No. 25 ( 2019-05-01), p. 1238-1238
    Kurzfassung: In this paper, a closed-form model for the drain current and intrinsic capacitances in organic thin-film transistors (TFTs) is presented which is a further improvement and development of the work reported in [1]. The model covers both below-threshold and above-threshold operation with a single charge-based current expression (1) that assumes transport of quasi-free carriers. Parameters Q’ ms/d are the densities of the accumulated quasi-free charges at the source and drain end of the channel, respectively. The effect of hopping transport is included in equation (2) by a power-law field-effect mobility model [2]. R c is the contact resistance, which can be nonlinear in the case of work function mismatch between contacts and organic semiconductor [3]. Drain-current saturation is controlled by parameter λ and expression (3). The current equation provides two views. One view is based on physics and allows for an estimation of the influence of trap densities and interface states on the TFT performance. In this case the accumulated charges are given by equation (4). Here, N st is the density of traps contributing to the drain current by hopping transport in a channel of thickness d m . N’ t,max is the density of filled deep traps and interface states at threshold, having only an influence on the electrostatics. Parameter α is the degradation of the subthreshold slope S given by (5) with respect to an ideal thermal slope of 60 mV/dec at T = 300 K. This expression allows for an extension of the model to include effects such as substrate bending by adapting the trap densities and insulator capacitance according to a geometrical deformation. In this case the mobility model has to take into account a change of the intermolecular spacing. The second view of the model is based on the threshold voltage from a circuit designer’s perspective. Expression (6) for the threshold voltage bridges the two views by allowing for the calculation of the accumulated charges using equation (7). Using the same accumulated charge densities Q’ ms/d as employed in the DC current equation, we have derived expressions for the intrinsic capacitances in staggered and coplanar TFTs. Using the Ward-Dutton partitioning scheme [4], the charge density in the channel can be assigned to source, drain and gate. For the integrals in equations (8), (9) and (10), closed-form equations have been derived [5] . Charges in the gate-to-contact overlap regions have been included for both the coplanar and the staggered architecture. This allows the intrinsic capacitances C ij = dQ i /dV j in quasi-static operation to be calculated. The model has been implemented in Verilog-A and validated vs. Sentaurus TCAD simulations and TFT measurements (Figs. 1, 2). The results show good agreement. The model uses a unified expression for the accumulated charges in the channel for DC and AC quasi-static operation, which owing to its link to physical parameters such as trap densities can serve as a basis for various extension, e.g., to account for mechanical deformation of flexible organic TFTs. Acknowledgements: This project was funded by the German Federal Ministry of Education and Research ("SOMOFLEX", No. 13FH015IX6) and EU H2020 RISE ("DOMINO", No. 645760). We acknowledge AdMOS GmbH, Germany for support and Keysight Technologies for license donation of IC-CAP. References: [1] Hain, M. Graef, B. Iñíguez, A. Kloes, “Charge based, continuous compact model for the channel current in organic thin-film transistors for all regions of operation,” Solid-State Electronics, vol. 133, p. 17, 2017 [2] Horowitz et al., Temperature and gate voltage dependence of hole mobility in polycrystalline oligothiophene thin film transistors, Journal of Applied Physics, vol. 87, p. 4456, 2000 [3] Pruefer, B. Iniguez, H. Klauk, and A. Kloes, “Compact modeling of non-linear contact resistance in staggered and coplanar organic thin-film transistors,” Proceedings Int’l Conf. Org. Electronics 2018, Grenoble, 2018 [4] E. Ward, R. W. Dutton, “A charge-oriented model for MOS transistor capacitances,” IEEE Journal of Solid-State Circuits, vol. 13, p. 703, 1978 [5] Leise, J. Pruefer, G. Darbandy, A. Kloes, “Charge-Based Compact Modeling of Capacitances in Staggered OTFTs”, submitted to Latin American Electron Devices Conference (LAEDC), Colombia, 2019 [6] Ante et al., “Contact resistance and megahertz operation of aggressively scaled organic transistors.,” Small, vol. 8, p. 73, 2012 [7] T. Zaki , S. Scheinert, I. Hörselmann, R. Rödel, F. Letzkus, H. Richter, U. Zschieschang, H. Klauk, and J. N. Burghartz, “Accurate capacitance modeling and characterization of organic thin-film transistors,” IEEE Transactions on Electron Devices, vol. 61, p. 98, 2014 Figure 1
    Materialart: Online-Ressource
    ISSN: 2151-2043
    Sprache: Unbekannt
    Verlag: The Electrochemical Society
    Publikationsdatum: 2019
    ZDB Id: 2438749-6
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  • 10
    Online-Ressource
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    The Electrochemical Society ; 2021
    In:  ECS Meeting Abstracts Vol. MA2021-01, No. 32 ( 2021-05-30), p. 1064-1064
    In: ECS Meeting Abstracts, The Electrochemical Society, Vol. MA2021-01, No. 32 ( 2021-05-30), p. 1064-1064
    Kurzfassung: We present a compact model for organic thin-film transistors (TFTs) that covers both below-threshold and above-threshold operation with a single charge-based current expression [1] . The effect of hopping transport is included by a power-law mobility model. Contact resistances for staggered and coplanar device structures (Fig. 1) are considered, which can be nonlinear in the case of work-function mismatch between contacts and organic semiconductor [2]. Short-channel effects in submicron transistors, such as threshold-voltage roll-off and drain-induced barrier lowering (DIBL), are included [3] . From the expression for the accumulated channel charge, a closed-form model for the drain-current variability due to carrier-number and correlated mobility fluctuations has been derived, relating these statistical variations to the trap density in the channel [4]. Furthermore, by applying a partitioning scheme, charges are explicitly attributed to the source and drain contacts, allowing the derivation of a charge-based capacitance model valid for quasi-static operation [5]. Charges in the gate-to-contact overlap regions have been included. Utilizing this device model in a transmission-line approach, a circuit simulation including non-quasistatic effects is possible [6]. In the circuit-simulation netlist, the TFT is replaced by a macro model consisting of a finite number of n single transistors, whereby each single transistor represents a section of the intrinsic channel capacitance and a segment of the intrinsic channel resistance. This model is able to capture the charging and discharging of the channel capacitance of each segment through the channel resistance of the adjacent transistors. In this way, the frequency dependence of the node-to-node capacitances of the full device is obtained. The compact model has been implemented in the hardware description language Verilog-A and verified using results of measurements performed on organic p-channel TFTs fabricated on flexible polyethylene naphthalate (PEN) substrates by stencil lithography (Figs. 2, 3). The TFTs consist of 25-nm-thick aluminum gate electrodes, a 5.3-nm-thick hybrid AlOx/SAM gate dielectric, 30-nm-thick gold (Au) source and drain contacts coated with a pentafluorobenzenethiol (PFBT) monolayer, and a 25-nm-thick vacuum-deposited layer of the small-molecule organic semiconductor DPh-DNTT [7,8]. The transmission-line approach has been verified with good accuracy by comparison with frequency-dependent admittance measurements and numerical simulations of the transient switching behavior of organic TFTs. For a transient analysis, the optimum number of segments required to achieve good agreement between the results from the model and those from TCAD simulations is approximately n=6. In conclusion, the model presented here is fully capable of providing accurate results in dc, small-signal ac, and transient circuit simulations, including short-channel effects. Furthermore, the same set of equations allows an estimation of the drain-current variability due to charge trapping. Acknowledgements: This project was funded by the German Federal Ministry of Education and Research ("SOMOFLEX", No. 13FH015IX6), German Research Foundation (DFG) under Grant KL 1042/9-2 (SPP FFlexCom), and EU H2020 RISE ("DOMINO", No. 645760). We acknowledge AdMOS GmbH, Germany for support. References: [1] Hain et al., “Charge based, continuous compact model for the channel current in organic thin-film transistors for all regions of operation,” Solid-State Electronics, vol. 133, p. 17, 2017. [2] Pruefer et al., “Compact modeling of non-linear contact resistance in staggered and coplanar organic thin-film transistors,” Proceedings Int’l Conf. Org. Electronics 2018, Grenoble, 2018. [3] Pruefer, et al., "Compact Modeling of Short-Channel Effects in Staggered Organic Thin-Film Transistors," IEEE Trans. Electron Devices, vol. 67, no. 11, pp. 5082-5090, September 2020. [4] Nikolaou, et al., "Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors due to Carrier-Number and Correlated-Mobility Fluctuation," IEEE Trans. Electron Devices, vol. 67, no. 11, pp. 4667-4671, September 2020. [5] Leise et al., "Charge-Based Compact Modeling of Capacitances in Staggered Multi-Finger OTFTs," IEEE Journal of the Electron Devices Society, vol. 8, pp. 396-406, March 2020 [6] Leise, J. Prüfer, A. Nikolaou, G. Darbandy, H. Klauk, B. Iniguez, and A. Kloes, "Macro model for AC and Transient Simulations of Organic Thin-Film Transistor Circuits Including Nonquasistatic Effects," IEEE Trans. Electron Devices, vol. 67, no. 11, pp. 4672-4676, September 2020. [7] W. Borchert et al., “Small contact resistance and high-frequency operation of flexible low-voltage inverted coplanar organic transistors,” Nature Commun., vol. 10, p. 1119, Mar. 2019. [8] Zaki et al., “Accurate capacitance modeling and characterization of organic thin-film transistors,” IEEE Trans. Electron Devices, vol. 61, p. 98, January 2014. Figure 1
    Materialart: Online-Ressource
    ISSN: 2151-2043
    Sprache: Unbekannt
    Verlag: The Electrochemical Society
    Publikationsdatum: 2021
    ZDB Id: 2438749-6
    Standort Signatur Einschränkungen Verfügbarkeit
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