In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 36, No. 2R ( 1997-02-01), p. 819-
Abstract:
Epitaxially grown poly(dimethylsilane) (PDMS) films have been prepared by evaporation on a highly-oriented poly(tetrafluoroethylene) (PTFE) layer which is formed by means of a mechanical deposition technique. The orientation characteristics of PDMS films are determined using atomic force microscopy, polarizing microscope images, X-ray diffraction patterns and polarized absorption spectra. The oriented regions lie along the grooves (1–5 µm wide) formed on the PTFE layer. The X-ray diffraction patterns and the polarized absorption spectra indicate that the (110) plane of the crystal structure is parallel to the substrate surface and that the c -axis of the Si-backbone chain is parallel to the grooves on the PTFE-coated substrate.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1997
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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