In:
Journal of Synchrotron Radiation, International Union of Crystallography (IUCr), Vol. 30, No. 1 ( 2023-01-01), p. 251-257
Abstract:
A compact spectrometer for medium-resolution resonant and non-resonant X-ray emission spectroscopy in von Hámos geometry is described. The main motivation for the design and construction of the spectrometer is to allow for acquisition of non-resonant X-ray emission spectra while measuring non-resonant X-ray Raman scattering spectra at beamline ID20 of the European Synchrotron Radiation Facility. Technical details are provided and the performance and possible use of the spectrometer are demonstrated by presenting results of several X-ray spectroscopic methods on various compounds.
Type of Medium:
Online Resource
ISSN:
1600-5775
DOI:
10.1107/S1600577522011171
Language:
Unknown
Publisher:
International Union of Crystallography (IUCr)
Publication Date:
2023
detail.hit.zdb_id:
2021413-3
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