In:
Beilstein Journal of Nanotechnology, Beilstein Institut, Vol. 11 ( 2020-09-08), p. 1361-1370
Abstract:
We studied the structural and electronic properties of 2,3,9,10-tetrafluoropentacene (F4PEN) on Ag(111) via X-ray standing waves (XSW), low-energy electron diffraction (LEED) as well as ultraviolet and X-ray photoelectron spectroscopy (UPS and XPS). XSW revealed that the adsorption distances of F4PEN in (sub)monolayers on Ag(111) were 3.00 Å for carbon atoms and 3.05 Å for fluorine atoms. The F4PEN monolayer was essentially lying on Ag(111), and multilayers adopted π-stacking. Our study shed light not only on the F4PEN–Ag(111) interface but also on the fundamental adsorption behavior of fluorinated pentacene derivatives on metals in the context of interface energetics and growth mode.
Type of Medium:
Online Resource
ISSN:
2190-4286
DOI:
10.3762/bjnano.11.120
Language:
English
Publisher:
Beilstein Institut
Publication Date:
2020
detail.hit.zdb_id:
2583584-1
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