In:
Surface Science Spectra, American Vacuum Society, Vol. 27, No. 2 ( 2020-12-01)
Kurzfassung:
X-ray photoelectron spectroscopy (XPS) is used to analyze the chemistry of the Ru(0001) film surface and the Ru/SiO2 interfacial region at different annealing conditions. The XPS spectra are collected under ultrahigh vacuum (base pressure of ∼5 × 10−10 Torr) condition using a SPECS electron spectrometer with a PHOIBOS 100 hemispherical energy analyzer and an XR 50 Al Kα x-ray source (1486.67 eV). High-resolution spectra of O 1s, Ru 3d/C 1s, and Si 2p together with survey scans are presented. The presence of 1 × 1 low energy diffraction pattern, collected from a 950 °C Ar/H2 step-annealed Ru(0001) sample, confirms the hexagonal periodicity of Ru(0001) surfaces.
Materialart:
Online-Ressource
ISSN:
1055-5269
,
1520-8575
DOI:
10.1116/6.0000172.N0165901
DOI:
10.1116/6.0000172.N0165902
DOI:
10.1116/6.0000172.N0165903
DOI:
10.1116/6.0000172.N0166001
DOI:
10.1116/6.0000172.N0166002
DOI:
10.1116/6.0000172.N0166003
DOI:
10.1116/6.0000172.N0166004
DOI:
10.1116/6.0000172.N0166005
DOI:
10.1116/6.0000172.N0166101
DOI:
10.1116/6.0000172.N0166102
DOI:
10.1116/6.0000172.N0166103
DOI:
10.1116/6.0000172.N0166104
DOI:
10.1116/6.0000172.N0166105
Sprache:
Englisch
Verlag:
American Vacuum Society
Publikationsdatum:
2020
ZDB Id:
2008474-2
SSG:
11
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