In:
Review of Scientific Instruments, AIP Publishing, Vol. 37, No. 12 ( 1966-12-01), p. 1650-1651
Abstract:
A new technique, called ``identical area microscopy,'' allows direct comparison of the results of optical, electron probe, and electron microscope studies of the same area. Although the contamination film which builds up on a specimen during electron probe studies can adversely influence analysis, it proves to be an excellent surface replica for electron microscope studies.
Type of Medium:
Online Resource
ISSN:
0034-6748
,
1089-7623
Language:
English
Publisher:
AIP Publishing
Publication Date:
1966
detail.hit.zdb_id:
209865-9
detail.hit.zdb_id:
1472905-2
SSG:
11
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