In:
Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 34 ( 1990), p. 201-211
Abstract:
X-ray photoelectron spectrometry (XPS) has been a well established surface analytical technique for approximately 20 years. Fhotoelectrons are ejected by characteristic x-radiation. In our investigations we use Alκα-radiation. The depth from which l-l/e of the measured signal comes, is restricted to a few nanometers by inelastic mean free paths of photoelectrons in solids.
Type of Medium:
Online Resource
ISSN:
0376-0308
,
2631-3626
DOI:
10.1154/S0376030800014488
Language:
English
Publisher:
Cambridge University Press (CUP)
Publication Date:
1990
detail.hit.zdb_id:
2498440-1
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