In:
Review of Scientific Instruments, AIP Publishing, Vol. 65, No. 8 ( 1994-08-01), p. 2519-2522
Abstract:
A UHV-compatible, high-temperature scanning tunneling microscope (STM) with a sample stage incorporating a Si wafer as a resistive heater is described. The design allows for rapid interchange of scanning tubes so that the maximum scan size can be varied. The thermal stability of the microscope is excellent, allowing real-time studies of faceting and grain growth of metal surfaces at temperatures up to 400 °C with a long term drift of ∼0.05 Å/s.
Type of Medium:
Online Resource
ISSN:
0034-6748
,
1089-7623
Language:
English
Publisher:
AIP Publishing
Publication Date:
1994
detail.hit.zdb_id:
209865-9
detail.hit.zdb_id:
1472905-2
SSG:
11
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